SDODEL MOSFET for performance enhancement
King Jien Chui, Samudra, G.S., Yee-Chia Yeo, Kheng-Chok Tee, Leong, K.-W., Kian Meng Tee, Benistant, F., Lap Chan
Published in IEEE electron device letters (01.03.2005)
Published in IEEE electron device letters (01.03.2005)
Get full text
Journal Article
Robust Electromigration reliability through engineering optimization
Ng, Wee Loon, Tee, Kheng Chok, Liu, Junfeng, Ee, Yong Chiang, Aubel, Oliver, Tan, Chuan Seng, Pey, Kin Leong
Published in Microelectronics and reliability (01.09.2014)
Published in Microelectronics and reliability (01.09.2014)
Get full text
Journal Article
Conference Proceeding
Improving the Accuracy of Modified Shift-and-Ratio Channel Length Extraction Method Using Scanning Capacitance Microscopy
Eng, Chee-Wee, Lau, Wai-Shing, Jiang, Yao-Yao, Vigar, David, Tee, Kheng-Chok, Chan, Lap, Lim, Vanissa Sei-Wei, Trigg, Alastair
Published in Japanese Journal of Applied Physics (01.04.2004)
Published in Japanese Journal of Applied Physics (01.04.2004)
Get full text
Journal Article
Effective Channel Length Shortening and Mobility Increase of p-Channel Metal Oxide Semiconductor Transistors Resulting in Higher Drive Current Using Short Source–Drain Diffusion Length
See, Kwang-Seng, Lau, Wai-Shing, Liao, Hong, Eng, Chee-Wee, Tee, Kian-Meng, Quek, Elgin Kiok-Boone, Tee, Kheng-Chok, Chan, Lap-Hung
Published in Japanese Journal of Applied Physics (2004)
Published in Japanese Journal of Applied Physics (2004)
Get full text
Journal Article
Selective Filling and Sintering of Copper Nanoclusters for Interconnect
Kheng Chok Tee, Lassesson, A., van Lith, J., Brown, S.A., Partridge, J.G., Schulze, M., Blaikie, R.J.
Published in IEEE transactions on nanotechnology (01.09.2007)
Published in IEEE transactions on nanotechnology (01.09.2007)
Get full text
Journal Article
Reduced Hot-Carrier Induced Degradation of NMOS I/O Transistors with Sub-micron Source-Drain Diffusion Length for 0.11 µm Dual Gate Oxide CMOS Technology
See, Kwang-Seng, Lau, Wai-Shing, Toh, Suey-Li, Liao, Hong, Lee, Jae Gon, Li, Kun, Quek, Elgin Kiok-Boone, Tee, Kheng-Chok, Chan, Lap-Hung
Published in Japanese Journal of Applied Physics (01.04.2005)
Published in Japanese Journal of Applied Physics (01.04.2005)
Get full text
Journal Article