by Lim, Y.K., Lim, Y.H., Seet, C.S., Zhang, B.C., Chok, K.L., See, K.H., Lee, T.J., Hsia, L.C., Pey, K.L.
Published in 2004 IEEE International Reliability Physics Symposium. Proceedings (2004)

by Craig, M., Deshazo, D., Prior, S., Tranchina, B., Erhart, M., Mahant-Shetti, S.S., Taylor, R., Xing, Y., Quek, E., Chok, K.L., Kamat, N., Redford, M.
Published in 2000 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop. ASMC 2000 (Cat. No.00CH37072) (2000)

by Craig, M, Deshazo, D, Prior, S, Tranchina, B, Erhart, M, Mahant-Shetti, S S, Taylor, R, Xing, Y, Quek, E, Chok, K L, Kamat, N, Redford, M
Published in IEEE International Symposium on Semiconductor Manufacturing conference proceedings (01.01.2000)

by KOH, L.-T, CHOK, K.-L, HE MING LI, Y.M. CHOOI, S
Year of Publication 1999