Reliability Issues and Models of sub-90nm NAND Flash Memory Cells
Hong Yang, Hyunjae Kim, Sung-il Park, Jongseob Kim, Sung-Hoon Lee, Jung-Ki Choi, Duhyun Hwang, Chulsung Kim, Mincheol Park, Keun-Ho Lee, Young-Kwan Park, Jai Kwang Shin, Jeong-Taek Kong
Published in 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings (2006)
Published in 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings (2006)
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