Effectiveness of a Guard Ring Utilizing an Inversion Layer Surrounding a Through Silicon Via
Kim, Kyung-Do, Jun, Byung-Jun, Kim, Jae-Bum, Choi, Kang-Sik, Cha, Seon-Yong, Lee, Jung-Hoon, Jeong, Jae-Goan, Lee, Seok-Hee, Lee, Jong-Ho
Published in IEEE electron device letters (01.03.2015)
Published in IEEE electron device letters (01.03.2015)
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