High-Temperature Complex Refractive Index of Phase Change Recording Medium of Ge 2 Sb 2 Te 5 Determined Using Phase Change Static Tester and Spectroscopic Ellipsometer
Li, Xue Zhe, Choi, Joong Kyu, Byun, Young Sup, Kim, Sang Youl, Sim, Kyung Soo, Kim, Soo Kyung
Published in Japanese Journal of Applied Physics (01.07.2008)
Published in Japanese Journal of Applied Physics (01.07.2008)
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