Separation of Lateral Migration Components by Hole During the Short-Term Retention Operation in 3-D NAND Flash Memories
Kim, Shinkeun, Kim, Haesoo, Woo, Changbeom, Choi, Gil-Bok, Seo, Moon-Sik, Shim, Hyunyoung, Noh, Keum Hwan, Shin, Hyungcheol
Published in IEEE transactions on electron devices (01.06.2020)
Published in IEEE transactions on electron devices (01.06.2020)
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Journal Article
Modeling of Charge Failure Mechanisms during the Short Term Retention Depending on Program/Erase Cycle Counts in 3-D NAND Flash Memories
Woo, Changbeom, Kim, Shinkeun, Park, Jaeyeol, Shin, Hyungcheol, Kim, Haesoo, Choi, Gil-Bok, Seo, Moon-Sik, Noh, Keum Hwan
Published in 2020 IEEE International Reliability Physics Symposium (IRPS) (01.04.2020)
Published in 2020 IEEE International Reliability Physics Symposium (IRPS) (01.04.2020)
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Conference Proceeding
On the RF Series Resistance Extraction of Nanoscale MOSFETs
CHOI, Gil-Bok, HONG, Seung-Ho, JUNG, Sung-Woo, JEONG, Yoon-Ha
Published in IEEE microwave and wireless components letters (01.10.2008)
Published in IEEE microwave and wireless components letters (01.10.2008)
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Journal Article
Low-Temperature Performance of Nanoscale MOSFET for Deep-Space RF Applications
HONG, Seung-Ho, CHOI, Gil-Bok, BAEK, Rock-Hyun, KANG, Hee-Sung, JUNG, Sung-Woo, JEONG, Yoon-Ha
Published in IEEE electron device letters (01.07.2008)
Published in IEEE electron device letters (01.07.2008)
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Journal Article
RTS noise reduction of 1Y-nm floating gate NAND flash memory using process optimization
Sungho Kim, Myeongwon Lee, Gil-Bok Choi, Jaekwan Lee, Yunbong Lee, Myoungkwan Cho, Kun-Ok Ahn, Jinwoong Kim
Published in 2015 IEEE International Reliability Physics Symposium (01.04.2015)
Published in 2015 IEEE International Reliability Physics Symposium (01.04.2015)
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Conference Proceeding
The Effect of a Si Capping Layer on RF Characteristics of High- k /Metal Gate SiGe Channel pMOSFETs
Min Sang Park, Kyong Taek Lee, Chang Yong Kang, Gil-Bok Choi, Hyun Chul Sagong, Chang Woo Sohn, Byoung-Gi Min, Jungwoo Oh, Majhi, Prashant, Hsing-Huang Tseng, Lee, Jack C, Jeong-Soo Lee, Jammy, Raj, Yoon-Ha Jeong
Published in IEEE electron device letters (01.10.2010)
Published in IEEE electron device letters (01.10.2010)
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Journal Article
Modeling of Charge Loss Mechanisms during the Short Term Retention Operation in 3-D NAND Flash Memories
Woo, Changbeom, Lee, Myeongwon, Kim, Shinkeun, Park, Jaeyeol, Choi, Gil-Bok, Seo, Moon-sik, Noh, Keum Hwan, Kang, Myounggon, Shin, Hyungcheol
Published in 2019 Symposium on VLSI Technology (01.06.2019)
Published in 2019 Symposium on VLSI Technology (01.06.2019)
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Conference Proceeding
New analog predistorer using mixing operation for independent control of IM3 components
Lee, Yong-Sub, Lee, Mun-Woo, Choi, Gil-bok, Jeong, Yoon-Ha
Published in Microwave and optical technology letters (01.10.2007)
Published in Microwave and optical technology letters (01.10.2007)
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Journal Article
교정환자의 의료서비스 질 만족과 가치만족이 재이용의사에 미치는 영향
민희홍, Hee Hong Min, 전지현, Ji Hyun Jeon, 최길복, Gil Bok Choi
Published in Han'guk Ch'iwisaeng Hakhoe chi (30.04.2016)
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Published in Han'guk Ch'iwisaeng Hakhoe chi (30.04.2016)
Journal Article
RF and hot carrier effects in metal gate/high-k dielectric nMOSFETs at cryogenic temperature
Hyun Chul Sagong, Kyong Taek Lee, Seung-Ho Hong, Hyun-Sik Choi, Gil-Bok Choi, Rock-Hyun Baek, Seung-Hyun Song, Min-Sang Park, Jae Chul Kim, Yoon-Ha Jeong, Sung-Woo Jung, Chang Yong Kang
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
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Conference Proceeding
Reliability of HFO2/SIO2 dielectric with strain engineering using CESL stressor
Jae Chul Kim, Kyong Taek Lee, Seung Hyun Song, Min Sang Park, Seung Ho Hong, Gil Bok Choi, Hyun Sik Choi, Rock Hyun Baek, Hyun Chul Sagong, Yoon-Ha Jeong, Sung Woo Jung, Chang Young Kang
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
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Conference Proceeding
일부 치위생학과 학생들의 행복지수에 미치는 영향요인
성정희, 유수민, 최길복, Sung, Jeong Hee, Yoo, Su Min, Choi, Gil bok
Published in Journal of the convergence on culture technology : JCCT (30.11.2018)
Published in Journal of the convergence on culture technology : JCCT (30.11.2018)
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Journal Article
A New Physical 1/f Noise Model for Double-Stack High-k Gate-Dielectric MOSFETs
SEUNG HYUN SONG, CHOI, Hyun-Sik, JEONG, Yoon-Ha, BAEK, Rock-Hyun, CHOI, Gil-Bok, PARK, Min-Sang, KYUNG TAEK LEE, HYUN CHUL SAGONG, LEE, Sang-Hyun, SUNG WOO JUNG, CHANG YONG KANG
Published in IEEE electron device letters (01.12.2009)
Published in IEEE electron device letters (01.12.2009)
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Journal Article
Dual Field Communication Scheme for UHF (860-960 MHz) Gen2 RFID Chip
Kang, Hee-Bok, Choi, Bok-Gil, Sung, Man Young, Chung, Jinyong
Published in Integrated ferroelectrics (01.01.2011)
Published in Integrated ferroelectrics (01.01.2011)
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