Novel Approach for the Reduction of Leakage Current Characteristics of 20 nm DRAM Capacitors With ZrO2-Based High-k Dielectrics
Jong-Min Lee, Dong-Sik Park, Seung-chul Yew, Soo-Ho Shin, Jun-Yong Noh, Hyoung-Sub Kim, Byoung-Deog Choi
Published in IEEE electron device letters (01.11.2017)
Published in IEEE electron device letters (01.11.2017)
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Journal Article
Effects of electron trapping and interface state generation on bias stress induced in indium-gallium-zinc oxide thin-film transistors
Han, Chang-Hoon, Kim, Sang-Sub, Kim, Kwang-Ryul, Baek, Do-Hyun, Kim, Sang-Soo, Choi, Byoung-Deog
Published in Japanese Journal of Applied Physics (01.08.2014)
Published in Japanese Journal of Applied Physics (01.08.2014)
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Journal Article
Channel Defect Analysis Method of a-IGZO TFTs on Polyimide for Flexible Displays
Kim, Hyo-Jung, Song, Jang-Kun, Choi, Byoung-Deog, Jeon, Bo-Hyeon, Park, Jong-Woo, Kim, June-Hwan, Kim, Soon-Kon, Song, Min-Jun, Choi, Pyung-Ho, Park, Jung-Min, Kim, Ki-Hwan
Published in Journal of semiconductor technology and science (01.10.2020)
Published in Journal of semiconductor technology and science (01.10.2020)
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Journal Article
Band alignment and defect states in amorphous GaInZnO thin films grown on SiO2/Si substrates
Heo, Sung, Chung, JaeGwan, Lee, Jae Cheol, Song, Taewon, Kim, Seong Heon, Yun, Dong-Jin, Lee, Hyung Ik, Kim, KiHong, Park, Gyeong Su, Oh, Jong Soo, Kwak, Dong Wook, Lee, DongWha, Cho, Hoon Young, Tahi, Dahlang, Kang, Hee Jae, Choi, Byoung-Deog
Published in Surface and interface analysis (01.10.2016)
Published in Surface and interface analysis (01.10.2016)
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Journal Article
Charge Pumping Technique to Measure Polarization Switching Charges of FeFETs
Nam, Kab-Jin, Park, Jung-Min, Choi, Byoung-Deog, Kwon, Kee-Won
Published in IEEE transactions on electron devices (01.09.2022)
Published in IEEE transactions on electron devices (01.09.2022)
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Journal Article
New Method for Reduction of the Capacitor Leakage Failure Rate Without Changing the Capacitor Structure or Materials in DRAM Mass Production
Lee, Jong-Min, Choi, Pyung-Ho, Kim, Soon-Kon, Oh, Jung-Hwan, Shin, Soo-Ho, Noh, Jun-Yong, Kim, Hyoung-Sub, Choi, Byoung-Deog
Published in IEEE transactions on electron devices (01.11.2018)
Published in IEEE transactions on electron devices (01.11.2018)
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Journal Article
Defect visualization of Cu(InGa)(SeS)2 thin films using DLTS measurement
Heo, Sung, Chung, JaeGwan, Lee, Hyung-Ik, Lee, Junho, Park, Jong-Bong, Cho, Eunae, Kim, KiHong, Kim, Seong Heon, Park, Gyeong Su, Lee, Dongho, Lee, Jaehan, Nam, Junggyu, Yang, JungYup, Lee, Dongwha, Cho, Hoon Young, Kang, Hee Jae, Choi, Pyung-Ho, Choi, Byoung-Deog
Published in Scientific reports (01.08.2016)
Published in Scientific reports (01.08.2016)
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Journal Article
Laser micromachining of CNT/Fe/Al2O3 nanocomposites
KIM, Kwang-Ryul, CHOI, Byoung-Deog, YI, Jun-Sin, CHO, Sung-Hak, CHOA, Yong-Ho, SHIN, Dong-Soo, BAE, Dong-Ho, KANG, Myung-Chang, JEONG, Young-Keun
Published in Transactions of Nonferrous Metals Society of China (01.09.2009)
Published in Transactions of Nonferrous Metals Society of China (01.09.2009)
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Journal Article
Defect states in amorphous SiNx:H compounds using thermally stimulated exo-electron emission
Heo, Sung, Park, Hyoungsun, chung, JaeGwan, Lee, Hyung Ik, Park, Jucheol, Kyoung, Yong Koo, Kim, Yong Su, Kim, KiHong, Byun, SunJung, Jeon, Woo Sung, Park, Gyeong Su, Choi, Pyungho, Choi, Byoung-Deog, Lee, Dongwha, Cho, Hoon Young, Kang, Hee Jae
Published in Thin solid films (01.10.2016)
Published in Thin solid films (01.10.2016)
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Journal Article
Carbonized surface curing for etch-back process
Sungjin Jang, In-cheol Kim, Kyu-yeol Lee, Soo-cheol Lee, In-soo Cho, Byoung-deog Choi
Published in 2012 SEMI Advanced Semiconductor Manufacturing Conference (01.05.2012)
Published in 2012 SEMI Advanced Semiconductor Manufacturing Conference (01.05.2012)
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Conference Proceeding
UV laser direct texturing for high efficiency multicrystalline silicon solar cell
Kim, Kwang-Ryul, Kim, Tae-Hoon, Park, Hyun-Ae, Kim, Sun-Yong, Cho, Sung-Hak, Yi, Junsin, Choi, Byoung-Deog
Published in Applied surface science (01.01.2013)
Published in Applied surface science (01.01.2013)
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Journal Article
Direct evidence of flat band voltage shift for TiN/LaO or ZrO/SiO 2 stack structure via work function depth profiling
Heo, Sung, Park, Hyoungsun, Ko, Dong-Su, Kim, Yong Su, Kyoung, Yong Koo, Lee, Hyung-Ik, Cho, Eunae, Lee, Hyo Sug, Park, Gyung-Su, Shin, Jai Kwang, Lee, Dongjin, Lee, Jieun, Jung, Kyoungho, Jeong, Moonyoung, Yamada, Satoru, Kang, Hee Jae, Choi, Byoung-Deog
Published in Scientific reports (02.03.2017)
Published in Scientific reports (02.03.2017)
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Journal Article
Ultrafast laser microfabrication of a trapping device for colorectal cancer cells
Kim, Kwang-Ryul, Kim, Hyun-Jin, Choi, Hyun-Il, Shin, Keong-Sub, Cho, Sung-Hak, Choi, Byoung-Deog
Published in Microelectronic engineering (01.06.2015)
Published in Microelectronic engineering (01.06.2015)
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Journal Article
Direct evidence of flat band voltage shift for TiN/LaO or ZrO/SiO2 stack structure via work function depth profiling
Heo, Sung, Park, Hyoungsun, Ko, Dong-Su, Kim, Yong Su, Kyoung, Yong Koo, Lee, Hyung-Ik, Cho, Eunae, Lee, Hyo Sug, Park, Gyung-Su, Shin, Jai Kwang, Lee, Dongjin, Lee, Jieun, Jung, Kyoungho, Jeong, Moonyoung, Yamada, Satoru, Kang, Hee Jae, Choi, Byoung-Deog
Published in Scientific reports (02.03.2017)
Published in Scientific reports (02.03.2017)
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Journal Article