Super-resolution laser probing of integrated circuits using algorithmic methods
Ravikumar, V. K., Chin, Jiann Min, Lua, Winson, Linarto, Nathan, Ranganathan, Gopinath, Trisno, Jonathan, Pey, K. L., Yang, Joel K. W.
Published in Nature communications (02.09.2022)
Published in Nature communications (02.09.2022)
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Journal Article
전자광학 파형 분석 프로세스
PEY KIN LEONG, RAVIKUMAR VENKAT KRISHNAN, CHIN JIANN MIN, YANG JOEL KWANG WEI
Year of Publication 13.05.2022
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Year of Publication 13.05.2022
Patent
Fault isolation in semiconductor product, process, physical and package failure analysis: Importance and overview
Chin, Jiann Min, Narang, Vinod, Zhao, Xiaole, Tay, Meng Yeow, Phoa, Angeline, Ravikumar, Venkat, Ei, Lwin Hnin, Lim, Soon Huat, Teo, Chea Wei, Zulkifli, Syahirah, Ong, Mei Chyn, Tan, Ming Chuan
Published in Microelectronics and reliability (01.09.2011)
Published in Microelectronics and reliability (01.09.2011)
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Journal Article
Conference Proceeding
Recent advances in fault isolation for semiconductor industry
Jiann Min Chin, Narang, Vinod, Meng Yeow Tay, Shei Lay Phoa, Venkat, Ravikumar, Lwin Hnin Ei, Soon Huat Lim, Chea Wei Teo, Zulkifli, Syahirah, Wen Qiu, Tan, Joseph, Ranganathan, Gopi, Zi Ying Oh, Fang Jie Foo
Published in Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2013)
Published in Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2013)
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Conference Proceeding
Computer Vision for Photon Emission Microscopy
Linarto, Nathan, Phoa, Angeline, Chin, Jiann Min
Published in 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (24.07.2023)
Published in 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (24.07.2023)
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Conference Proceeding
ELECTRO-OPTIC WAVEFORM ANALYSIS PROCESS
YANG, Joel Kwang Wei, RAVIKUMAR, Venkat Krishnan, CHIN, Jiann Min, PEY, Kin Leong
Year of Publication 13.03.2024
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Year of Publication 13.03.2024
Patent
ELECTRO-OPTIC WAVEFORM ANALYSIS PROCESS
YANG, Joel Kwang Wei, RAVIKUMAR, Venkat Krishnan, CHIN, Jiann Min, PEY, Kin Leong
Year of Publication 23.11.2022
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Year of Publication 23.11.2022
Patent
ELECTRO-OPTIC WAVEFORM ANALYSIS PROCESS
YANG, Joel Kwang Wei, RAVIKUMAR, Venkat Krishnan, CHIN, Jiann Min, PEY, Kin Leong
Year of Publication 03.08.2022
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Year of Publication 03.08.2022
Patent
Electro-optic waveform analysis process
Ravikumar, Venkat Krishnan, Wei, Joel Yang Kwang, Chin, Jiann Min, Leong, Pey Kin
Year of Publication 21.09.2021
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Year of Publication 21.09.2021
Patent
ELECTRO-OPTIC WAVEFORM ANALYSIS PROCESS
RAVIKUMAR, Venkat Krishnan, CHIN, Jiann Min, LEONG, Pey Kin, WEI, Joel Yang Kwang
Year of Publication 01.04.2021
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Year of Publication 01.04.2021
Patent
ELECTRO-OPTIC WAVEFORM ANALYSIS PROCESS
Ravikumar, Venkat Krishnan, Wei, Joel Yang Kwang, Chin, Jiann Min, Leong, Pei Kin
Year of Publication 01.04.2021
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Year of Publication 01.04.2021
Patent
Probe placement for laser probing system
Ravikumar, Venkat Krishnan, Linarto, Nathan, Chin, Jiann Min, Seah, Yi Xuan, Phoa, Shei Lay, Lua, Wen Tsann, Ranganathan, Gopinath
Year of Publication 08.09.2020
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Year of Publication 08.09.2020
Patent
PULSED SINGLE CONTACT OPTICAL BEAM INDUCED CURRENT ANALYSIS OF INTEGRATED CIRCUITS
DANIEL S. H. CHAN, JACOB C. H. PHANG, SIVARAMAKRISHNA KOLACHINA, CHIN JIANN MIN
Year of Publication 29.10.2004
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Year of Publication 29.10.2004
Patent
Optical analysis for SOI integrated circuits
Bruce, Michael R, Gilfeather, Glen P, Goruganthu, Rama R, Chin, Jiann Min, McBride, Shawn
Year of Publication 06.04.2004
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Year of Publication 06.04.2004
Patent
Optical analysis for SOI integrated circuits
BRUCE MICHAEL R, GORUGANTHU RAMA R, CHIN JIANN MIN, GILFEATHER GLEN P, MCBRIDE SHAWN
Year of Publication 06.04.2004
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Year of Publication 06.04.2004
Patent
Pulsed single contact optical beam induced current analysis of integrated circuits
Min, Chin Jiann, Kolachina, Sivaramakrishna, Phang, Jacob C. H, Chan, Daniel S. H
Year of Publication 29.04.2003
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Year of Publication 29.04.2003
Patent
Pulsed single contact optical beam induced current analysis of integrated circuits
CHAN DANIEL S. H, KOLACHINA SIVARAMAKRISHNA, MIN CHIN JIANN, PHANG JACOB C. H
Year of Publication 29.04.2003
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Year of Publication 29.04.2003
Patent