Novel dual direction PNP with self-bias ring structure
Tsung-Che Tsai, Jam-Wem Lee, Ming-Fu Tsai, Yi-Feng Chang, Shui-Ming Cheng, Ming-Hsiang Song
Published in 2014 IEEE International Reliability Physics Symposium (01.06.2014)
Published in 2014 IEEE International Reliability Physics Symposium (01.06.2014)
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Conference Proceeding
Bias Temperature Stress (BTS) induced ESD device's leakage issue and Its preventing solutions in smart power technology
Chien-Fu Huang, Yi-Feng Chang, Shui-Ming Cheng, Ming-Hsiang Song
Published in 2013 IEEE International Reliability Physics Symposium (IRPS) (01.04.2013)
Published in 2013 IEEE International Reliability Physics Symposium (IRPS) (01.04.2013)
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Conference Proceeding
A unified approach to profiling the lateral distributions of both oxide charge and interface states in n-MOSFET's under various bias stress conditions
Shui-Ming Cheng, Cherng-Ming Yih, Jun-Chyi Yeh, Song-Nian Kuo, Chung, S.S.
Published in IEEE transactions on electron devices (01.11.1997)
Published in IEEE transactions on electron devices (01.11.1997)
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Journal Article
High flexibility SCR clamp for ESD protection in BCD power technology
Yi-Feng Chang, Tsung-Che Tsai, Wan-Yen Lin, Chia-Wei Hsu, Jam-Wem Lee, Shui-Ming Cheng, Ming-Hsiang Song
Published in Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2014 (01.09.2014)
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Published in Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2014 (01.09.2014)
Conference Proceeding
Schottky emitter high holding voltage ESD clamp in BCD power technology
Chi-Kuang Chen, Chien-Fu Huang, Yi-Feng Chang, Jam-Wem Lee, Shui-Ming Cheng, Ming-Hsiang Song
Published in Electrical Overstress / Electrostatic Discharge Symposium Proceedings 2012 (01.09.2012)
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Published in Electrical Overstress / Electrostatic Discharge Symposium Proceedings 2012 (01.09.2012)
Conference Proceeding
High performance 50 nm CMOS devices for microprocessor and embedded processor core applications
Shih-Fen Huang, Chih-Yung Lin, Yu-Shyang Huang, Schafbauer, T., Eller, M., Yao-Ching Cheng, Shui-Ming Cheng, Sportouch, S., Wei Jin, Rovedo, N., Grassmann, A., Yimin Huang, Brighten, J., Liu, C.H., von Ehrenwall, B., Chen, N., Jia Chen, Park, O.S., Commons, M., Thomas, A., Ming-Tsan Lee, Rauch, S., Clevenger, L., Kaltalioglu, E., Pak Leung, Jenkon Chen, Schiml, T., Wann, C.
Published in International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224) (2001)
Published in International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224) (2001)
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Conference Proceeding
SCRs with checker board layouts
Yang, Han-Jen, Cheng, Shui-Ming, Su, Yu-Ti, Lin, Wun-Jie, Song, Ming-Hsiang
Year of Publication 29.09.2020
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Year of Publication 29.09.2020
Patent