Characterization of the H2 sensing mechanism of Pd-promoted SnO2 by XAS in operando conditions
Safonova, Olga V, Neisius, Thomas, Ryzhikov, Andrey, Chenevier, Bernard, Gaskov, Aleksandre M, Labeau, Michel
Published in Chemical communications (Cambridge, England) (07.11.2005)
Published in Chemical communications (Cambridge, England) (07.11.2005)
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Critical current density distribution in superconducting oxide layer of Bi2Sr2CaCu2Ox/Ag composite tapes
KITAGUCHI, H, MIAO, H, KUMAKURA, H, TOGANO, K, CHENEVIER, B
Published in Physica. C, Superconductivity (20.05.1998)
Published in Physica. C, Superconductivity (20.05.1998)
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Preface
Chenevier, Bernard, Farcy, Alexis, Maîtrejean, Sylvain
Published in Microelectronic engineering (01.03.2010)
Published in Microelectronic engineering (01.03.2010)
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Second order incommensurate phase transition in 25L-Ta2O5
AUDIER, M, CHENEVIER, B, ROUSSEL, H, LINTANF SALAÜN, A
Published in Journal of solid state chemistry (01.09.2010)
Published in Journal of solid state chemistry (01.09.2010)
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A very promising piezoelectric property of Ta2O5 thin films. I: Monoclinic-trigonal phase transition
AUDIER, M, CHENEVIER, B, ROUSSEL, H, VINCENT, L, PENA, A, LINTANF SALAÜN, A
Published in Journal of solid state chemistry (01.08.2011)
Published in Journal of solid state chemistry (01.08.2011)
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A very promising piezoelectric property of Ta2O5 thin films. II: Birefringence and piezoelectricity
AUDIER, M, CHENEVIER, B, ROUSSEL, H, VINCENT, L, PENA, A, SALAÜN, A. Lintanf
Published in Journal of solid state chemistry (01.08.2011)
Published in Journal of solid state chemistry (01.08.2011)
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MAM2009: A single-session Workshop devoted to Materials Research, Materials Properties and Interactions: Proceedings of the Eighteenth European Workshop on Materials for Advanced Metallization 2009
CHEVOLLEAU, Thierry, CHENEVIER, Bernard, LARTIGUE, Colette
Published in Microelectronic engineering (2010)
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Published in Microelectronic engineering (2010)
Conference Proceeding
Post Si(C)N hillock nucleation and growth in IC copper lines controlled by diffusional creep
Timma, A., Caubet, P., Chenevier, B., Thomas, O., Kaouache, B., Dumas, L., Normandon, P., Giraudin, J.C.
Published in Microelectronic engineering (01.03.2010)
Published in Microelectronic engineering (01.03.2010)
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Conference Proceeding
Origin of the C49-C54 volume anomaly in TiSi sub(2) thin films: An in-situ XRD and TEM analysis
Chaix-Pluchery, O, Matko, I, Madar, R, La Via, F, Chenevier, Bernard
Published in Microelectronic engineering (01.10.2002)
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Published in Microelectronic engineering (01.10.2002)
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Annealing of thin Zr films on Si1-xGex(0 ≤ x ≤ 1): X-ray diffraction and Raman studies
CHAIX-PLUCHERY, O, CHENEVIER, B, AUBRY-FORTUNA, V, MATKO, I
Published in The Journal of physics and chemistry of solids (01.10.2002)
Published in The Journal of physics and chemistry of solids (01.10.2002)
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