Preparation method of silicon carbide epitaxial wafer for high-voltage and ultrahigh-voltage device
ZOU YU, PENG TONGHUA, GUO YU, ZHANG PING, ZHANG XINHE, CHEN SHISHI, YANG JIAN, LIU CHUNJUN
Year of Publication 30.08.2022
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Year of Publication 30.08.2022
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Solid material and semiconductor device internal defect detection method
ZHANG GUOQI, ZHANG ZHIXIN, ZHANG XINHE, CHEN SHISHI, WEN ZHENGXIN, GAO BO, YANG ANLI
Year of Publication 15.09.2020
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Year of Publication 15.09.2020
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Method of measuring impurity activation energy in semiconductor
ZHANG GUOQI, ZHANG ZHIXIN, ZHANG XINHE, CHEN SHISHI, WEN ZHENGXIN, GAO BO, YANG ANLI
Year of Publication 03.07.2020
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Year of Publication 03.07.2020
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Silicon carbide semi-accumulation type channel MOSFET device and preparation method thereof
YE HUAIYU, ZHANG GUOQI, ZHANG XINHE, WEN ZHENGXIN, CHEN SHISHI, YANG ANLI
Year of Publication 08.05.2020
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Year of Publication 08.05.2020
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System and method for testing longitudinal distribution of minority carrier lifetime
ZHANG GUOQI, ZHANG XINHE, CHEN SHISHI, WEN ZHENGXIN, GAO BO, YANG ANLI
Year of Publication 08.05.2020
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Year of Publication 08.05.2020
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Test structure and test method for contact resistivity and channel mobility
ZHANG GUOQI, ZHANG XINHE, CHEN SHISHI, WEN ZHENGXIN, GAO BO, YANG ANLI
Year of Publication 05.05.2020
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Year of Publication 05.05.2020
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