Carbon Nanotube SRAM in 5-nm Technology Node Design, Optimization, and Performance Evaluation-Part I: CNFET Transistor Optimization
Chen, Rongmei, Chen, Lin, Liang, Jie, Cheng, Yuanqing, Elloumi, Souhir, Lee, Jaehyun, Xu, Kangwei, Georgiev, Vihar P., Ni, Kai, Debacker, Peter, Asenov, Asen, Todri-Sanial, Aida
Published in IEEE transactions on very large scale integration (VLSI) systems (01.04.2022)
Published in IEEE transactions on very large scale integration (VLSI) systems (01.04.2022)
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Journal Article
Atomistic- to Circuit-Level Modeling of Doped SWCNT for On-Chip Interconnects
Jie Liang, Jaehyun Lee, Berrada, Salim, Georgiev, Vihar P., Pandey, Reeturaj, Rongmei Chen, Asenov, Asen, Todri-Sanial, Aida
Published in IEEE transactions on nanotechnology (01.11.2018)
Published in IEEE transactions on nanotechnology (01.11.2018)
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Journal Article
Single-Event Multiple Transients in Conventional and Guard-Ring Hardened Inverter Chains Under Pulsed Laser and Heavy-Ion Irradiation
Rongmei Chen, Fengqi Zhang, Wei Chen, Lili Ding, Xiaoqiang Guo, Chen Shen, Yinhong Luo, Wen Zhao, Lisang Zheng, Hongxia Guo, Yinong Liu, Fleetwood, Daniel M.
Published in IEEE transactions on nuclear science (01.09.2017)
Published in IEEE transactions on nuclear science (01.09.2017)
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Journal Article
A Modeling Study of Stacked Cu-CNT TSV on Electrical, Thermal, and Reliability Analysis
Xu, Baohui, Chen, Rongmei, Zhou, Jiuren, Liang, Jie
Published in IEEE transactions on electron devices (01.01.2024)
Published in IEEE transactions on electron devices (01.01.2024)
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Journal Article
A Modeling Study on Electrical and Thermal Behavior of CNT TSV for Multilayer Structure
Xu, Baohui, Chen, Rongmei, Zhou, Jiuren, Liang, Jie
Published in IEEE transactions on electron devices (01.09.2023)
Published in IEEE transactions on electron devices (01.09.2023)
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Journal Article
Modeling the Dependence of Single-Event Transients on Strike Location for Circuit-Level Simulation
Ding, Lili, Chen, Wei, Wang, Tan, Chen, Rongmei, Luo, Yinhong, Zhang, Fengqi, Pan, Xiaoyu, Sun, Huabo, Chen, Lei
Published in IEEE transactions on nuclear science (01.06.2019)
Published in IEEE transactions on nuclear science (01.06.2019)
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Journal Article
Analysis of multiple cell upset characteristics for logical circuits in radiation environment
Ding, Lili, Wang, Tan, Zhang, Fengqi, Pan, Xiaoyu, Chen, Wei, Chen, Rongmei, Yang, Guoqing
Published in Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment (21.12.2020)
Published in Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment (21.12.2020)
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Journal Article
Extended Methodology to Determine SRAM Write Margin in Resistance-Dominated Technology Node
Liu, Hsiao-Hsuan, Salahuddin, Shairfe M., Abdi, Dawit, Chen, Rongmei, Weckx, Pieter, Matagne, Philippe, Catthoor, Francky
Published in IEEE transactions on electron devices (01.06.2022)
Published in IEEE transactions on electron devices (01.06.2022)
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Journal Article
Total ionizing dose sensitivity of a radiation-tolerant phase-locked loop in a 130 nm SOI technology
Zhuojun Chen, Min Lin, Ding Ding, Yunlong Zheng, Zehua Sang, Shichang Zou, Rongmei Chen
Published in 2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2016)
Published in 2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2016)
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Conference Proceeding
Development of high power transient electromagnetic field sensors
Yang Chao, Meng Cui, Chen Rongmei, Li Xin
Published in 2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC) (01.05.2015)
Published in 2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC) (01.05.2015)
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Conference Proceeding
Single-Event Double Transients in Inverter Chains Designed With Different Transistor Widths
Zhao, Wen, He, Chaohui, Chen, Wei, Chen, Rongmei, Cong, Peitian, Zhang, Fengqi, Wang, Zujun, Guo, Xiaoqiang, Ding, Lili
Published in IEEE transactions on nuclear science (01.07.2019)
Published in IEEE transactions on nuclear science (01.07.2019)
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Journal Article
Heavy-ion and pulsed laser induced single-event double transients in nanometer inverter chain
Zhao, Wen, Chen, Wei, He, Chaohui, Chen, Rongmei, Zhang, Fengqi, Guo, Xiaoqiang, Lu, Chao, Shen, Chen
Published in Radiation effects and defects in solids (04.03.2023)
Published in Radiation effects and defects in solids (04.03.2023)
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Journal Article
The inhibition of glycosaminoglycan incorporation influences the cell proliferation and cytodifferentiation in cultured embryonic mouse molars
Jiang, Beizhan, Xu, Fangfang, Li, Lefeng, Chen, Weiting, Hong, Shebin, Chen, Rongmei
Published in Journal of molecular histology (01.02.2019)
Published in Journal of molecular histology (01.02.2019)
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Journal Article
Carbon Nanotube SRAM in 5-nm Technology Node Design, Optimization, and Performance Evaluation-Part II: CNT Interconnect Optimization
Chen, Rongmei, Chen, Lin, Liang, Jie, Cheng, Yuanqing, Elloumi, Souhir, Lee, Jaehyun, Xu, Kangwei, Georgiev, Vihar P., Ni, Kai, Debacker, Peter, Asenov, Asen, Todri-Sanial, Aida
Published in IEEE transactions on very large scale integration (VLSI) systems (01.04.2022)
Published in IEEE transactions on very large scale integration (VLSI) systems (01.04.2022)
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Journal Article
Study of Total-Ionizing-Dose Effects on a Single-Event-Hardened Phase-Locked Loop
Chen, Zhuojun, Ding, Ding, Dong, Yemin, Shan, Yi, Zhou, Shuxing, Hu, Yuanyuan, Zheng, Yunlong, Peng, Chao, Chen, Rongmei
Published in IEEE transactions on nuclear science (01.04.2018)
Published in IEEE transactions on nuclear science (01.04.2018)
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Journal Article
Modeling the impact of well contacts on SEE response with bias-dependent Single-Event compact model
Ding, Lili, Chen, Wei, Guo, Hongxia, Wang, Tan, Chen, Rongmei, Luo, Yinhong, Zhang, Fengqi, Pan, Xiaoyu
Published in Microelectronics and reliability (01.02.2018)
Published in Microelectronics and reliability (01.02.2018)
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Journal Article
Investigation of Pt-Salt-Doped-Standalone- Multiwall Carbon Nanotubes for On-Chip Interconnect Applications
Liang, Jie, Chen, Rongmei, Ramos, Raphael, Lee, Jaehyun, Okuno, Hanako, Kalita, Dipankar, Georgiev, Vihar, Berrada, Salim, Sadi, Toufik, Uhlig, Benjamin, Lilienthal, Katherina, Dhavamani, Abitha, Konemann, Fabian, Gotsmann, Bernd, Goncalves, Goncalves, Chen, Bingan, Asenov, Asen, Dijon, Jean, Todri-Sanial, Aida
Published in IEEE transactions on electron devices (01.05.2019)
Published in IEEE transactions on electron devices (01.05.2019)
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Journal Article