by Zhao, Wen, Chen, Wei, He, Chaohui, Chen, Rongmei, Cong, Peitian, Zhang, Fengqi, Lu, Chao, Shen, Chen, Zheng, Lisang, Guo, Xiaoqiang, Ding, Lili
Published in Microelectronics and reliability (01.06.2020)

by Chen, Rongmei, Liang, Jie, Lee, Jaehyun, Georgiev, Vihar P., Ramos, Raphael, Okuno, Hanako, Kalita, Dipankar, Cheng, Yuanqing, Zhang, Liuyang, Pandey, Reetu R., Amoroso, Salvatore, Millar, Campbell, Asenov, Asen, Dijon, Jean, Todri-Sanial, Aida
Published in IEEE transactions on electron devices (01.11.2018)

by Zhao, Wen, He, Chaohui, Chen, Wei, Chen, Rongmei, Cong, Peitian, Zhang, Fengqi, Wang, Zujun, Shen, Chen, Zheng, Lisang, Guo, Xiaoqiang, Ding, Lili
Published in Microelectronics and reliability (01.08.2018)

by Zhao, Wen, Chen, Wei, He, Chaohui, Chen, Rongmei, Wang, Liang, Wang, Zujun, Cong, Peitian, Guo, Xiaoqiang, Shen, Chen
Published in Radiation effects and defects in solids (01.11.2020)

by Tan Zhaojie, Chen Rongmei, Meng Cui, Li Xin
Published in 2013 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC) (01.05.2013)

by Chen, Rongmei, Liang, Jie, Lee, Jaehyun, Georgiev, Vihar P., Ramos, Raphael, Okuno, Hanako, Kalita, Dipankar, Cheng, Yuanqing, Zhang, Liuyang, Pandey, Reetu R., Amoroso, Salvatore, Millar, Campbell, Asenov, Asen, Dijon, Jean, Todri-Sanial, Aida
Published in IEEE transactions on electron devices (01.11.2018)

by Chen, Rongmei, Chen, Wei, Guo, Xiaoqiang, Shen, Chen, Zhang, Fengqi, Zheng, Lisang, Zhao, Wen, Ding, Lili, Luo, Yinhong, Guo, Hongxia, Wang, Yuanming, Liu, Yinong
Published in Microelectronics and reliability (01.04.2017)

by Verreck, Devin, Wambacq, Piet, Van De Put, Maarten, Ahmed, Zubair, Smets, Quentin, Afzalian, Aryan, Duflou, Rutger, Wu, Xiangyu, Mirabelli, Gioele, Chen, Rongmei, Asselberghs, Inge, Kar, Gouri Sankar
Published in 2023 IEEE International Solid- State Circuits Conference (ISSCC) (19.02.2023)

by Chen, R. M., Mahatme, N. N., Diggins, Z. J., Wang, L., Zhang, E. X., Chen, Y. P., Liu, Y. N., Narasimham, B., Witulski, A. F., Bhuva, B. L., Fleetwood, D. M.
Published in IEEE transactions on nuclear science (01.08.2017)

by Xie, Feifan, Chen, Rongmei, Wei, Tiwei
Published in 2024 IEEE 74th Electronic Components and Technology Conference (ECTC) (28.05.2024)

by Uhlig, B., Liang, J., Lee, J., Ramos, R., Dhavamani, A., Nagy, N., Dijon, J., Okuno, H., Kalita, D., Georgiev, V., Asenov, A., Amoroso, S., Wang, L., Millar, C., Konemann, F., Gotsmann, B., Goncalves, G., Chen, B., Pandey, R. R., Chen, R., Todri-Sanial, A.
Published in 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.03.2018)

by ZHANG WEIPING, CHEN RONGMEI
Year of Publication 09.02.2024

by CHEN RONGMEI
Year of Publication 07.10.2015

by Naeim, Mohamed, Yang, Hanqi, Chen, Pinhong, Bao, Rong, Dekeyser, Antoine, Sisto, Giuliano, Brunion, Moritz, Chen, Rongmei, Van der Plas, Geert, Beyne, Eric, Milojevic, Dragomir
Published in 2023 IEEE International 3D Systems Integration Conference (3DIC) (10.05.2023)

by Sisto, Giuliano, Debacker, Peter, Chen, Rongmei, Van Der Plas, Geert, Chou, Richard, Beyne, Eric, Milojevic, Dragomir
Published in 2019 International 3D Systems Integration Conference (3DIC) (01.10.2019)

by Sisto, Giuliano, Chen, Rongmei, Chou, Richard, Van der Plas, Geert, Beyne, Eric, Metcalfe, Rod, Milojevic, Dragomir
Published in 2021 ACM/IEEE International Workshop on System Level Interconnect Prediction (SLIP) (01.11.2021)

by VELOSO, Anabela, MATAGNE, Philippe, CHEN, Rongmei, ENEMAN, Geert, DE KEERSGIETER, An
Year of Publication 05.06.2024

by Chen, Rongmei, Veloso, Anabela, Eneman, Geert, De Keersgieter, An, Matagne, Philippe
Year of Publication 30.05.2024

by Ding, Lili, Chen, Wei, Wang, Tan, Luo, Yinhong, Zhang, Fengqi, Chen, Rongmei, Pan, Xiaoyu, Sun, Huabo, Chen, Lei
Published in 2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2018)

by CHEN RONGMEI, YU HAIBING
Year of Publication 01.03.2022