Search Results - "CHEN CHIEN HUEI (ADAM)" :: K.UTB vyhledávací portál | TBU Library Retrieval Portal

DESIGN-BASED INSPECTION USING REPEATING STRUCTURES

DESIGN-BASED INSPECTION USING REPEATING STRUCTURES

by CHEN CHIEN HUEI ADAM, KULKARNI ASHOK
Year of Publication 14.02.2014

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Patent

DYNAMIC CARE AREAS

DYNAMIC CARE AREAS

by KULKARNI ASHOK V, CHEN CHIEN HUEI ADAM
Year of Publication 20.08.2013

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Patent

DECISION TREE CONSTRUCTION FOR AUTOMATIC CLASSIFICATION OF DEFECTS ON SEMICONDUCTOR WAFERS

DECISION TREE CONSTRUCTION FOR AUTOMATIC CLASSIFICATION OF DEFECTS ON SEMICONDUCTOR WAFERS

by MAHER CHRISTOPHER, HUET PATRICK, NG TAI KAM, JORDAN JOHN R. III, CHEN CHIEN HUEI ADAM
Year of Publication 11.07.2016

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Patent

DATA PERTURBATION FOR WAFER INSPECTION OR METROLOGY SETUP

DATA PERTURBATION FOR WAFER INSPECTION OR METROLOGY SETUP

by MAHADEVAN MOHAN, KIRKWOOD JASON, CHEN CHIEN HUEI ADAM, GUPTA AJAY, WU KENONG, THATTAISUNDARAM GOVIND, KULKARNI ASHOK, RONG SONGNIAN
Year of Publication 29.08.2013

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Patent

SEMICONDUCTOR DEVICE PROPERTY EXTRACTION, GENERATION, VISUALIZATION, AND MONITORING METHODS

SEMICONDUCTOR DEVICE PROPERTY EXTRACTION, GENERATION, VISUALIZATION, AND MONITORING METHODS

by WALLINGFORD RICHARD, CHEN CHIEN HUEI (ADAM), ZHANG YONG, KULKARNI ASHOK, CAMPOCHIARO CECELIA, DUFFY BRIAN
Year of Publication 06.05.2010

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Patent

METHODS AND SYSTEMS FOR GENERATING INFORMATION TO BE USED FOR SELECTING VALUES FOR ONE OR MORE PARAMETERS OF A DETECTION ALGORITHM

METHODS AND SYSTEMS FOR GENERATING INFORMATION TO BE USED FOR SELECTING VALUES FOR ONE OR MORE PARAMETERS OF A DETECTION ALGORITHM

by BECKER BARRY, MAHER CHRIS, VAN RIET MICHAEL J, CHEN STEPHANIE, BALAKRISHNAN SUBRAMANIAN, CHEN HONG, KOWALSKI MICHAEL, CHEN CHIEN HUEI (ADAM), TUMMALA SURYANARAYANA, LIN JASON Z
Year of Publication 16.03.2011

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Patent

DETERMINATION OF CARE AREAS FOR INSPECTION OF WAFERS

DETERMINATION OF CARE AREAS FOR INSPECTION OF WAFERS

by CHEN, Chien-Huei Adam, KULKARNI, Ashok V
Year of Publication 10.01.2018

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Patent

DYNAMIC CARE AREAS

DYNAMIC CARE AREAS

by CHEN, Chien-Huei Adam, KULKARNI, Ashok V
Year of Publication 28.12.2016

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Patent

METHOD AND SYSTEM FOR DEFECT CLASSIFICATION

METHOD AND SYSTEM FOR DEFECT CLASSIFICATION

by JORDAN III, John R, VENKATARAMAN, Sankar, SINHA, Harsh, CHEN, Adam Chien-Huei, HE, Li, YING, Huajun
Year of Publication 28.01.2021

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Patent

Method and system for defect classification

Method and system for defect classification

by Harsh, Sinha, He, Li, Venkataraman, Sankar, Chen, Chien-Huei Adam, Jordan, John R, Ying, Huajun
Year of Publication 19.11.2019

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Patent

Design-based inspection using repeating structures

Design-based inspection using repeating structures

by KULKARNI ASHOK V, CHEN CHIEN-HUEI (ADAM)
Year of Publication 27.10.2015

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Patent

Computerimplementierte entwurfsbasierte Inspektion unter Verwendung wiederholender Strukturen

Computerimplementierte entwurfsbasierte Inspektion unter Verwendung wiederholender Strukturen

by Chen, Chien-Huei Adam, Kulkarni, Ashok
Year of Publication 10.09.2020

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Patent

Dynamic care areas

Dynamic care areas

by CHEN CHIEN-HUEI ADAM, KULKARNI ASHOK V
Year of Publication 15.07.2014

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Patent

Method and System for Defect Classification

Method and System for Defect Classification

by Harsh, Sinha, He, Li, Venkataraman, Sankar, Chen, Chien-Huei Adam, Jordan, John R, Ying, Huajun
Year of Publication 26.04.2018

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Patent

Method and system for defect classification

Method and system for defect classification

by He Li, Venkataraman Sankar, Chen Chien-Huei Adam, Jordan, III John R, Ying Huajun, Sinha Harsh
Year of Publication 20.02.2018

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Patent

DETERMINATION OF CARE AREAS FOR INSPECTION OF WAFERS

DETERMINATION OF CARE AREAS FOR INSPECTION OF WAFERS

by KULKARNI, ASHOK V, CHEN, CHIEN-HUEI ADAM
Year of Publication 05.06.2013

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Patent

DESIGN-BASED INSPECTION USING REPEATING STRUCTURES

DESIGN-BASED INSPECTION USING REPEATING STRUCTURES

by KULKARNI, ASHOK, CHEN, CHIEN-HUEI ADAM
Year of Publication 27.12.2012

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Patent

DESIGN-BASED INSPECTION USING REPEATING STRUCTURES

DESIGN-BASED INSPECTION USING REPEATING STRUCTURES

by KULKARNI, ASHOK, CHEN, CHIEN-HUEI ADAM
Year of Publication 04.10.2012

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Patent

Design-Based Inspection Using Repeating Structures

Design-Based Inspection Using Repeating Structures

by KULKARNI ASHOK V, CHEN CHIEN-HUEI (ADAM)
Year of Publication 27.09.2012

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Patent

Decision tree construction for automatic classification of defects on semiconductor wafers

Decision tree construction for automatic classification of defects on semiconductor wafers

by Maher Chris, Ng Tai-Kam, Huet Patrick, Jordan, III John Raymond, Chen Chien-Huei (Adam)
Year of Publication 08.11.2016

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Patent