Classic McEliece on the ARM Cortex-M4
Chen, Ming-Shing, Chou, Tung
Published in IACR transactions on cryptographic hardware and embedded systems (09.07.2021)
Published in IACR transactions on cryptographic hardware and embedded systems (09.07.2021)
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Journal Article
Optimizing BIKE for the Intel Haswell and ARM Cortex-M4
Chen, Ming-Shing, Chou, Tung, Krausz, Markus
Published in IACR transactions on cryptographic hardware and embedded systems (09.07.2021)
Published in IACR transactions on cryptographic hardware and embedded systems (09.07.2021)
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Journal Article
Securing M2M With Post-Quantum Public-Key Cryptography
Shih, Jie-Ren, Hu, Yongbo, Hsiao, Ming-Chun, Chen, Ming-Shing, Shen, Wen-Chung, Yang, Bo-Yin, Wu, An-Yeu, Cheng, Chen-Mou
Published in IEEE journal on emerging and selected topics in circuits and systems (01.03.2013)
Published in IEEE journal on emerging and selected topics in circuits and systems (01.03.2013)
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Journal Article
A Novel Method to Improve Laser Anneal Worsened Negative Bias Temperature Instability in 40-nm CMOS Technology
Ming-Shing Chen, Yean-Kuen Fang, Feng-Renn Juang, Yen-Ting Chiang, Cheng-I Lin, Tung-Hsing Lee, Chou, Sam, Ning, Judy
Published in IEEE transactions on electron devices (01.03.2011)
Published in IEEE transactions on electron devices (01.03.2011)
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Journal Article
Effect of Finger Pitch on the Driving Ability of a 40-nm MOSFET With Contact Etch Stop Layer Strain in Multifinger Gated Structure
Chen, Ming-Shing, Fang, Yean-Kuen, Juang, Feng-Renn, Chiang, Yen-Ting, Lin, Cheng-I, Lee, Tung-Hsing, Tseng, Chih-Yu, Chou, Sam, Chen, Chii-Wen
Published in IEEE transactions on electron devices (01.06.2010)
Published in IEEE transactions on electron devices (01.06.2010)
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Journal Article
Effect of Silicon Thickness on Contact-Etch-Stop-Layer-Induced Silicon/Buried-Oxide Interface Stress for Partially Depleted SOI
Chien-Ting Lin, Yean-Kuen Fang, Wen-Kuan Yeh, Tung-Hsing Lee, Ming-Shing Chen, Che-Hua Hsu, Liang-Wei Chen, Li-Wei Cheng, Ma, M.
Published in IEEE electron device letters (01.12.2006)
Published in IEEE electron device letters (01.12.2006)
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Journal Article
A Novel Strain Method for Enhancement of 90-nm Node and Beyond FUSI-Gated CMOS Performance
Chien-Ting Lin, Yean-Kuen Fang, Wen-Kuan Yeh, Tung-Hsing Lee, Ming-Shing Chen, Chieh-Ming Lai, Che-Hua Hsu, Liang-Wei Chen, Li-Wei Cheng, Ma, M.
Published in IEEE electron device letters (01.02.2007)
Published in IEEE electron device letters (01.02.2007)
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Journal Article
Postquantum SSL/TLS for Embedded Systems
Yun-An Chang, Ming-Shing Chen, Jong-Shian Wu, Bo-Yin Yang
Published in 2014 IEEE 7th International Conference on Service-Oriented Computing and Applications (01.11.2014)
Published in 2014 IEEE 7th International Conference on Service-Oriented Computing and Applications (01.11.2014)
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Conference Proceeding
Effect of STI stress on leakage and Vccmin of a sub-65 nm node low-power SRAM
Lee, Tung-Hsing, Fang, Yean-Kuen, Chiang, Yen-Ting, Chiu, H Y, Chen, Ming-Shing, Cheng, Osbert
Published in Journal of physics. D, Applied physics (07.10.2008)
Published in Journal of physics. D, Applied physics (07.10.2008)
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Journal Article
Information in hierarchical modular system
Liou, Cheng-Yuan, Chen, Ming-Shing, Liou, Daw-Chih
Published in Frontiers of electrical and electronic engineering in China (01.03.2011)
Published in Frontiers of electrical and electronic engineering in China (01.03.2011)
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Journal Article
Effect of Etch Stop Layer Stress on Negative Bias Temperature Instability of Deep Submicron p-Type Metal–Oxide–Semiconductor Field Effect Transistors with Dual Gate Oxide
Chen, Ming-Shing, Fang, Yean-Kuen, Lee, Tung-Hsing, Lin, Chien-Ting, Chiang, Yen-Ting, Ko, Joe, Sheu, Yau Kae, Shen, Tsong Lin, Liao, Wen Yi
Published in Japanese Journal of Applied Physics (01.04.2008)
Published in Japanese Journal of Applied Physics (01.04.2008)
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Journal Article