by Gupta, Mohit Kumar, Weckx, Pieter, Schuddinck, Pieter, Jang, Doyoung, Chehab, Bilal, Cosemans, Stefan, Ryckaert, Julien, Dehaene, Wim
Published in IEEE transactions on electron devices (01.08.2021)

by Gupta, Mohit Kumar, Weckx, Pieter, Schuddinck, Pieter, Jang, Doyoung, Chehab, Bilal, Cosemans, Stefan, Ryckaert, Julien, Dehaene, Wim
Published in IEEE transactions on electron devices (01.12.2021)

by Sisto, Giuliano, Zografos, Odysseas, Chehab, Bilal, Kakarla, Naveen, Xiang, Yang, Milojevic, Dragomir, Weckx, Pieter, Hellings, Geert, Ryckaert, Julien
Published in IEEE transactions on very large scale integration (VLSI) systems (01.10.2022)

by Gupta, Anshul, Pedreira, Olalla Varela, Arutchelvan, Goutham, Zahedmanesh, Houman, Devriendt, Katia, Mertens, Hans, Tao, Zheng, Ritzenthaler, Romain, Wang, Shouhua, Radisic, Dunja, Kenis, Karine, Teugels, Lieve, Sebai, Farid, Lorant, Christophe, Jourdan, Nicolas, Chan, Boon Teik, Subramanian, Sujith, Schleicher, Filip, Hopf, Toby, Peter, Antony Premkumar, Rassoul, Nouredine, Debruyn, Haroen, Demonie, Ingrid, Siew, Yong Kong, Chiarella, Thomas, Briggs, Basoene, Zhou, Xiuju, Rosseel, Erik, De Keersgieter, An, Capogreco, Elena, Litta, Eugenio Dentoni, Boccardi, Guillaume, Baudot, Sylvain, Mannaert, Geert, Bontemps, Noemie, Sepulveda, A., Mertens, Sofie, Kim, Min-Soo, Dupuy, Emmanuel, Vandersmissen, Kevin, Paolillo, Sara, Yakimets, Dmitry, Chehab, Bilal, Favia, Paola, Drijbooms, Christel, Cousserier, Joris, Jaysankar, Manoj, Lazzarino, Frederic, Morin, Pierre, Altamirano, Efrain, Mitard, Jerome, Wilson, Christopher J., Holsteyns, Frank, Boemmels, Juergen, Demuynck, Steven, Tokei, Zsolt, Horiguchi, Naoto
Published in IEEE transactions on electron devices (01.12.2020)

by Zografos, Odysseas, Chehab, Bilal, Schuddinck, Pieter, Mirabelli, Gioele, Kakarla, Naveen, Xiang, Yang, Weckx, Pieter, Ryckaert, Julien
Published in 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE) (14.03.2022)

by Gao, Zhan, Malagi, Santosh, Hu, Min-Chun, Swenton, Joe, Baert, Rogier, Huisken, Jos, Chehab, Bilal, Goossen, Kees, Marinissen, Erik Jan
Published in 2019 IEEE International Test Conference (ITC) (01.11.2019)

by RYCKAERT, Julien, CHEHAB, Bilal, BHUWALKA, Krishna, Kumar
Year of Publication 09.10.2024

by CHEHAB, Bilal, CHAN, Boon Teik, RADISIC, Dunja
Year of Publication 01.05.2024

by Ryckaert, Julien, Chehab, Bilal, Chan, Boon Teik
Year of Publication 09.11.2023

by Ryckaert, Julien, Chehab, Bilal, Chan, Boon Teik
Year of Publication 08.11.2023

by CHEHAB, Bilal, CHAN, Boon Teik, RADISIC, Dunja
Year of Publication 28.06.2023

by Chehab, Bilal, Radisic, Dunja, Chan, Boon Teik
Year of Publication 22.06.2023

by RYCKAERT, Julien, CHEHAB, Bilal, BHUWALKA, Krishna
Year of Publication 08.06.2023

by Liebmann, Lars, Chehab, Bilal, Bouche, Guillaume, Shi, Quan
Year of Publication 20.06.2024

by Ryckaert, Julien, Chehab, Bilal, Schuddinck, Pieter, Weckx, Pieter
Year of Publication 08.06.2023

by RYCKAERT, Julien, WECKX, Pieter, CHEHAB, Bilal, SCHUDDINCK, Pieter
Year of Publication 07.06.2023

by BIESEMANS, Serge, RYCKAERT, Julien, CHEHAB, Bilal, TOKEI, Zsolt, VEGA GONZALEZ, Victor Hugo, HORIGUCHI, Naoto
Year of Publication 21.08.2024

by RYCKAERT, Julien, LIU, Hsiao-Hsuan, CHEHAB, Bilal, CHAN, Boon Teik, SALAHUDDIN, Shairfe Muhammad
Year of Publication 26.06.2024

by Ryckaert, Julien, Chehab, Bilal, Chan, Boon Teik, Liu, Hsiao-Hsuan, Salahuddin, Shairfe Muhammad
Year of Publication 20.06.2024

by Baert, Rogier, Ciofi, Ivan, Patli, Sudhir, Zografos, Odysseas, Sarkar, Satadru, Chehab, Bilal, Jang, Doyoung, Spessot, Alessio, Ryckaert, Julien, Tokei, Zsolt
Published in 2020 IEEE International Interconnect Technology Conference (IITC) (05.10.2020)