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Year of Publication 03.08.2006
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On-chip erase pulse counter for efficient erase verify BIST (built-in-self-test) mode
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Year of Publication 16.12.2003
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On-chip erase pulse counter for efficient erase verify BIST (built-in-self-test) mode
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Year of Publication 16.12.2003
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On-chip repair of defective address of core flash memory cells
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Year of Publication 07.10.2003
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Year of Publication 07.10.2003
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On-chip repair of defective address of core flash memory cells
Bill, Colin, Cheah, Ken Cheong, Bautista, Jr., Edward V, Halim, Azrul, Hamilton, Darlene G
Year of Publication 07.10.2003
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Year of Publication 07.10.2003
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Address sequencer within BIST (Built-in-Self-Test) system
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Year of Publication 07.03.2006
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Year of Publication 07.03.2006
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BUILT-IN-SELF-TEST OF FLASH MEMORY CELLS
CHEAH, KEN, CHEONG, KUCERA, JOSEPH, SALLEH, SYAHRIZAL, BILL, COLIN, S, BAUTISTA, EDWARD, V., JR, LAW, CHEE, BOON, TEH, BOON, TANG, LEE, WENG, FOOK, HALIM, AZRUL, HAMILTON, DARLENE
Year of Publication 23.11.2005
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Year of Publication 23.11.2005
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