by Jai-Ming Lin, Tai-Ting Chen, Yen-Fu Chang, Wei-Yi Chang, Ya-Ting Shyu, Yeong-Jar Chang, Juin-Ming Lu
Published in 2018 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) (01.11.2018)

by Su, Yu-Shih, Hon, Wing-Kai, Yang, Cheng-Chih, Chang, Shih-Chieh, Chang, Yeong-Jar
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.12.2010)

by Lin, Jai-Ming, Chang, Wei-Yi, Hsieh, Hao-Yuan, Shyu, Ya-Ting, Chang, Yeong-Jar, Lu, Juin-Ming
Published in IEEE transactions on very large scale integration (VLSI) systems (01.09.2021)

by Lin, Jai-Ming, Chen, Tai-Ting, Hsieh, Hao-Yuan, Shyu, Ya-Ting, Chang, Yeong-Jar, Lu, Juin-Ming
Published in IEEE transactions on very large scale integration (VLSI) systems (01.05.2021)

by Ming-Dou Ker, Po-Yen Chiu, Fu-Yi Tsai, Yeong-Jar Chang
Published in 2009 IEEE International Symposium on Circuits and Systems (ISCAS) (01.05.2009)

by Po-Yen Chiu, Ming-Dou Ker, Fu-Yi Tsai, Yeong-Jar Chang
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)

by SU, Chin-Lung, HUANG, Rei-Fu, WU, Cheng-Wen, HUNG, Chien-Chung, KAO, Ming-Jer, CHANG, Yeong-Jar, WU, Wen-Ching
Published in 2004 International Conferce on Test (2004)

by Yu-Shih Su, Wing-Kai Hon, Cheng-Chih Yang, Shih-Chieh Chang, Yeong-Jar Chang
Published in 2009 IEEE/ACM International Conference on Computer-Aided Design - Digest of Technical Papers (01.11.2009)

by HUANG, Rei-Fu, SU, Chin-Lung, WU, Cheng-Wen, LIN, Shen-Tien, LUO, Kun-Lun, CHANG, Yeong-Jar
Published in 13th Asian Test Symposium (2004)

by DENG, Li-Ming, HUANG, Rei-Fu, WU, Cheng-Wen, CHANG, Yeong-Jar, WU, Wen-Ching
Published in Records of the 2004 International Workshop on Memory Technology, Design and Testing, 2004 (2004)

by Chung-Fu Lin, Yeong-Jar Chang
Published in 2008 IEEE International Symposium on VLSI Design, Automation and Test (VLSI-DAT) (01.04.2008)

by Chiou, Lih-Yih, Yang, Tsung-Han, Syu, Jian-Tang, Chang, Che-Pin, Chang, Yeong-Jar
Published in 2019 IEEE International Conference on Artificial Intelligence Circuits and Systems (AICAS) (01.03.2019)

by Chiou, Lih-Yih, Chang, Chun-Hao, Lu, Liang-Ying, Yang, Wei-Hsuan, Chang, Yeong-Jar, Lu, Juin-Ming
Published in 2018 International SoC Design Conference (ISOCC) (01.11.2018)

by Chung-Fu Lin, Chia-Fu Huang, De-Chung Lu, Chih-Chiang Hsu, Wen-Tsung Chiu, Yu-Wei Chen, Yeong-Jar Chang
Published in 2008 IEEE International Test Conference (01.10.2008)

by Ming-Shae Wu, Chung-Len Lee, Yeong-Jar Chang, Wen-Ching Wu
Published in 14th Asian Test Symposium (ATS'05) (2005)

by Yeong-Jar Chang, Shen-Tien Lin, Kun-Lun Luo, Wen-Ching Wu
Published in 2003 International Symposium on VLSI Technology, Systems and Applications. Proceedings of Technical Papers. (IEEE Cat. No.03TH8672) (2003)

by Yeong-Jar Chang, Soon-Jyh Chang, Jung-Chi Ho, Chee-Kian Ong, Ting Cheng, Wen-Ching Wu
Published in 2003 International Symposium on VLSI Technology, Systems and Applications. Proceedings of Technical Papers. (IEEE Cat. No.03TH8672) (2003)

by Liu, Chen-Yu, Kuo, En-Jui, Lin, Chu-Hsuan Abraham, Young, Jason Gemsun, Chang, Yeong-Jar, Hsieh, Min-Hsiu, Goan, Hsi-Sheng
Year of Publication 18.05.2024

by Liu, Chen-Yu, Kuo, En-Jui, Lin, Chu-Hsuan Abraham, Chen, Sean, Young, Jason Gemsun, Chang, Yeong-Jar, Hsieh, Min-Hsiu
Year of Publication 26.02.2024

by Young, Jason Gemsun, Tseng, Ying Wei, Chang, Yeong-Jar
Year of Publication 27.06.2024