Electrical characteristics of 20-nm junctionless Si nanowire transistors
Park, Chan-Hoon, Ko, Myung-Dong, Kim, Ki-Hyun, Baek, Rock-Hyun, Sohn, Chang-Woo, Baek, Chang Ki, Park, Sooyoung, Deen, M.J., Jeong, Yoon-Ha, Lee, Jeong-Soo
Published in Solid-state electronics (01.07.2012)
Published in Solid-state electronics (01.07.2012)
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Journal Article
World's First GAA 3nm Foundry platform Technology (SF3) with Novel Multi-Bridge-Channel-FET (MBCFET™) Process
Jeong, Jaehun, Lee, Sang Hyeon, Masuoka, Sada-Aki, Min, Shincheol, Lee, Sanghoon, Kim, Seungkwon, Myung, Taehun, Choi, Byungha, Sohn, Chang-Woo, Kim, Sung Won, Choi, Jeongmin, Park, Jungmin, Lee, Hyungjong, Kim, Taeyoung, Kim, Seokhoon, Yasuda-Masuoka, Yuri, Ku, Ja-Hum, Jeong, Gitae
Published in 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (11.06.2023)
Published in 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (11.06.2023)
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Conference Proceeding
Analytic Model of S/D Series Resistance in Trigate FinFETs With Polygonal Epitaxy
Chang-Woo Sohn, Chang Yong Kang, Myung-Dong Ko, Do-Young Choi, Hyun Chul Sagong, Eui-Young Jeong, Chan-Hoon Park, Sang-Hyun Lee, Ye-Ram Kim, Chang-Ki Baek, Jeong-Soo Lee, Lee, J. C., Yoon-Ha Jeong
Published in IEEE transactions on electron devices (01.04.2013)
Published in IEEE transactions on electron devices (01.04.2013)
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Journal Article
Device Design Guidelines for Nanoscale FinFETs in RF/Analog Applications
Chang-Woo Sohn, Chang Yong Kang, Rock-Hyun Baek, Do-Young Choi, Hyun Chul Sagong, Eui-Young Jeong, Chang-Ki Baek, Jeong-Soo Lee, Lee, J. C., Yoon-Ha Jeong
Published in IEEE electron device letters (01.09.2012)
Published in IEEE electron device letters (01.09.2012)
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Journal Article
New Insight Into PBTI Evaluation Method for nMOSFETs With Stacked High- k/IL Gate Dielectric
Sang Kyung Lee, Minseok Jo, Chang-Woo Sohn, Chang Yong Kang, Lee, J. C., Yoon-Ha Jeong, Byoung Hun Lee
Published in IEEE electron device letters (01.11.2012)
Published in IEEE electron device letters (01.11.2012)
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Journal Article
Comprehensive Study of Quasi-Ballistic Transport in High- \kappa/Metal Gate nMOSFETs
Hyun Chul Sagong, Chang Yong Kang, Chang-Woo Sohn, Kanghoon Jeon, Eui-Young Jeong, Do-Young Choi, Chang-Ki Baek, Jeong-Soo Lee, Lee, J. C., Yoon-Ha Jeong
Published in IEEE electron device letters (01.11.2011)
Published in IEEE electron device letters (01.11.2011)
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Journal Article
Improved Degradation and Recovery Characteristics of SiGe p-Channel Metal--Oxide--Semiconductor Field-Effect Transistors under Negative-Bias Temperature Stress
Choi, Do-Young, Sohn, Chang-Woo, Sagong, Hyun Chul, Jung, Eui-Young, Kang, Chang Yong, Lee, Jeong-Soo, Jeong, Yoon-Ha
Published in Japanese Journal of Applied Physics (01.04.2013)
Published in Japanese Journal of Applied Physics (01.04.2013)
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Journal Article
Channel Geometry Impact and Narrow Sheet Effect of Stacked Nanosheet
Yeung, Chun Wing, Zhang, Jingyun, Chao, Robin, Kwon, Ohseong, Vega, Reinaldo, Tsutsui, Gen, Miao, Xin, Zhang, Chen, Sohn, Chang-Woo, Moon, Bum Ki, Razavieh, Ali, Frougier, Julien, Greene, Andrew, Galatage, Rohit, Li, Juntao, Wang, Miaomiao, Loubet, Nicolas, Robison, Robert, Basker, Veeraraghavan, Yamashita, Tenko, Guo, Dechao
Published in 2018 IEEE International Electron Devices Meeting (IEDM) (01.12.2018)
Published in 2018 IEEE International Electron Devices Meeting (IEDM) (01.12.2018)
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Conference Proceeding
Simple S/D Series Resistance Extraction Method Optimized for Nanowire FETs
Kim, Ye-Ram, Baek, Chang-Ki, Lee, Jeong-Soo, Jeong, Yoon-Ha, Lee, Sang-Hyun, Sohn, Chang-Woo, Choi, Do-Young, Sagong, Hyun-Chul, Kim, Sungho, Jeong, Eui-Young, Kim, Dong-Won, Hong, Hyeongsun
Published in IEEE electron device letters (01.07.2013)
Published in IEEE electron device letters (01.07.2013)
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Journal Article
Interfacial-Layer-Driven Dielectric Degradation and Breakdown of HfSiON/SiON Gate Dielectric nMOSFETs
CHOI, Do-Young, KYONG TAEK LEE, BAEK, Chang-Ki, CHANG WOO SOHN, HYUN CHUL SAGONG, JUNG, Eui-Young, LEE, Jeong-Soo, JEONG, Yoon-Ha
Published in IEEE electron device letters (01.10.2011)
Published in IEEE electron device letters (01.10.2011)
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Journal Article
Analysis of Abnormal Upturns in Capacitance-Voltage Characteristics for MOS Devices With High- k Dielectrics
Chang-Woo Sohn, Hyun Chul Sagong, Eui-Young Jeong, Do-Young Choi, Min Sang Park, Jeong-Soo Lee, Chang Yong Kang, Jammy, R, Yoon-Ha Jeong
Published in IEEE electron device letters (01.04.2011)
Published in IEEE electron device letters (01.04.2011)
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Journal Article
New Investigation of Hot-Carrier Degradation on RF Small-Signal Parameter and Performance in High- k/Metal-Gate nMOSFETs
Sagong, Hyun Chul, Kang, Chang Yong, Sohn, Chang-Woo, Choi, Do-Young, Jeong, Eui-Young, Baek, Chang-Ki, Lee, Jeong-Soo, Jeong, Yoon-Ha
Published in IEEE electron device letters (01.12.2011)
Published in IEEE electron device letters (01.12.2011)
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Journal Article
스트레스 유발성 심근증 환자들의 원내 사망과 좌심실 기능 회복의 예측인자
김소연, So Yeon Kim, 김장영, Jang Young Kim, 박용현, Yong Hyun Park, 홍경순, Kyung Soon Hong, 조경임, Kyoung Im Cho, 조현수, Hyun Su Jo, 홍그루, Gue Ru Hong, 손창우, Chang Woo Sohn, 손장원, Jang Won Sohn, 윤준철, Joon Chul Yoon, 이상희, Sang Hee Lee, 박종선, Jong Sun Park, 신동구, Dong Gu Shin, 김영조, Young Jo Kim, 김형섭, Hyung Seop Kim, 김기식, Kee sik Kim
Published in The Korean journal of medicine (01.07.2011)
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Published in The Korean journal of medicine (01.07.2011)
Journal Article
The Effect of a Si Capping Layer on RF Characteristics of High- k /Metal Gate SiGe Channel pMOSFETs
Min Sang Park, Kyong Taek Lee, Chang Yong Kang, Gil-Bok Choi, Hyun Chul Sagong, Chang Woo Sohn, Byoung-Gi Min, Jungwoo Oh, Majhi, Prashant, Hsing-Huang Tseng, Lee, Jack C, Jeong-Soo Lee, Jammy, Raj, Yoon-Ha Jeong
Published in IEEE electron device letters (01.10.2010)
Published in IEEE electron device letters (01.10.2010)
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Journal Article
Effect of fin height of tapered FinFETs on the sub-22-nm System on Chip (SoC) application using TCAD simulation
Chang-Woo Sohn, Chang Yong Kang, Myung-Dong Ko, Rock-Hyun Baek, Chan-Hoon Park, Sung-Ho Kim, Eui-Young Jeong, Jeong-Soo Lee, Kirsch, P., Jammy, R., Lee, J. C., Yoon-Ha Jeong
Published in 2013 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) (01.04.2013)
Published in 2013 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) (01.04.2013)
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Conference Proceeding
Comparative study of fabricated junctionless and inversion-mode nanowire FETs
Chan-Hoon Park, Myung-Dong Ko, Ki-Hyun Kim, Chang-Woo Sohn, Chang Ki Baek, Yoon-Ha Jeong, Jeong-Soo Lee
Published in 69th Device Research Conference (01.06.2011)
Published in 69th Device Research Conference (01.06.2011)
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Conference Proceeding
Comparative study of geometry-dependent capacitances of planar FETs and double-gate FinFETs: Optimization and process variation
Chang-Woo Sohn, Chang Yong Kang, Rock-Hyun Baek, Do-Young Choi, Hyun Chul Sagong, Eui-Young Jeong, Jeong-Soo Lee, Kirsch, P., Jammy, R., Lee, J. C., Yoon-Ha Jeong
Published in Proceedings of Technical Program of 2012 VLSI Technology, System and Application (01.04.2012)
Published in Proceedings of Technical Program of 2012 VLSI Technology, System and Application (01.04.2012)
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Conference Proceeding