Search Results - "CHANG ELLIS" :: K.UTB vyhledávací portál | TBU Library Retrieval Portal

INSPECTING A WAFER AND/OR PREDICTING ONE OR MORE CHARACTERISTICS OF A DEVICE BEING FORMED ON A WAFER

INSPECTING A WAFER AND/OR PREDICTING ONE OR MORE CHARACTERISTICS OF A DEVICE BEING FORMED ON A WAFER

by PARK ALLEN, MARCUCCILLI GINO, CHANG ELLIS, ROBINSON JOHN, WIDMANN AMIR
Year of Publication 04.05.2020

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Patent

METROLOGY TARGET IDENTIFICATION DESIGN AND VERIFICATION

METROLOGY TARGET IDENTIFICATION DESIGN AND VERIFICATION

by ADEL MICHAEL, SHUSTERMAN TAL, CHANG ELLIS, DROR CHEN
Year of Publication 10.09.2019

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Patent

METHODS AND SYSTEMS FOR UTILIZING DESIGN DATA IN COMBINATION WITH INSPECTION DATA

METHODS AND SYSTEMS FOR UTILIZING DESIGN DATA IN COMBINATION WITH INSPECTION DATA

by PARK ALLEN, ROSE PETER, CHANG ELLIS, KEKARE SAGAR, ZAFAR KHURRAM
Year of Publication 07.08.2018

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Patent

METROLOGY OPTIMIZED INSPECTION

METROLOGY OPTIMIZED INSPECTION

by PARK ALLEN, CHANG ELLIS, MACNAUGHTON CRAIG
Year of Publication 13.07.2016

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Patent

Evolution of Wafer Inspection and Review Methodology

Evolution of Wafer Inspection and Review Methodology

by Chang, Ellis, Park, Allen
Published in ECS transactions (06.03.2009)

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Journal Article

METHODS AND SYSTEMS FOR UTILIZING DESIGN DATA IN COMBINATION WITH INSPECTION DATA

METHODS AND SYSTEMS FOR UTILIZING DESIGN DATA IN COMBINATION WITH INSPECTION DATA

by PARK ALLEN, ROSE PETER, CHANG ELLIS, KEKARE SAGAR, ZAFAR KHURRAM
Year of Publication 24.10.2017

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Patent

COMPUTER-IMPLEMENTED METHODS COMPUTER-READABLE MEDIA AND SYSTEMS FOR CLASSIFYING DEFECTS DETECTED IN A MEMORY DEVICE AREA ON A WAFER

COMPUTER-IMPLEMENTED METHODS COMPUTER-READABLE MEDIA AND SYSTEMS FOR CLASSIFYING DEFECTS DETECTED IN A MEMORY DEVICE AREA ON A WAFER

by CHANG ELLIS, PAE, YEON HO, CHOI, SUN YONG
Year of Publication 28.04.2017

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Patent

METHODS AND SYSTEMS FOR UTILIZING DESIGN DATA IN COMBINATION WITH INSPECTION DATA

METHODS AND SYSTEMS FOR UTILIZING DESIGN DATA IN COMBINATION WITH INSPECTION DATA

by PARK ALLEN, ROSE PETER, CHANG ELLIS, KEKARE SAGAR, ZAFAR KHURRAM
Year of Publication 05.12.2016

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Patent

COMPUTER-IMPLEMENTED METHODS, CARRIER MEDIA, AND SYSTEMS FOR GENERATING A METROLOGY SAMPLING PLAN

COMPUTER-IMPLEMENTED METHODS, CARRIER MEDIA, AND SYSTEMS FOR GENERATING A METROLOGY SAMPLING PLAN

by PARK ALLEN, CHANG ELLIS
Year of Publication 29.06.2010

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Patent

SYSTEM CONFIGURED TO DIVIDE DEFECT DETECTED ON WAFER ACCORDING TO BIN RANGE

SYSTEM CONFIGURED TO DIVIDE DEFECT DETECTED ON WAFER ACCORDING TO BIN RANGE

by KHURRAM ZAFAR, PARK ALLEN, ROSE PETER, CHANG ELLIS, SAGAR KEKARE
Year of Publication 04.08.2016

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Patent

METHOD FOR USING DESIGN DATA IN COMBINATION WITH INSPECTION DATA

METHOD FOR USING DESIGN DATA IN COMBINATION WITH INSPECTION DATA

by KHURRAM ZAFAR, PARK ALLEN, ROSE PETER, CHANG ELLIS, SAGAR KEKARE
Year of Publication 28.07.2016

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Patent

METHOD FOR USING DESIGN DATA IN COMBINATION WITH INSPECTION DATA

METHOD FOR USING DESIGN DATA IN COMBINATION WITH INSPECTION DATA

by KHURRAM ZAFAR, PARK ALLEN, ROSE PETER, CHANG ELLIS, SAGAR KEKARE
Year of Publication 16.06.2016

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Patent

COMPUTER-IMPLEMENTED METHODS, COMPUTER-READABLE MEDIA, AND SYSTEMS FOR CLASSIFYING DEFECTS DETECTED IN A MEMORY DEVICE AREA ON A WAFER

COMPUTER-IMPLEMENTED METHODS, COMPUTER-READABLE MEDIA, AND SYSTEMS FOR CLASSIFYING DEFECTS DETECTED IN A MEMORY DEVICE AREA ON A WAFER

by CHANG ELLIS, PAE, YEON HO, CHOI, SUN YONG
Year of Publication 01.06.2016

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Patent

METHOD FOR USING DESIGN DATA IN COMBINATION WITH INSPECTION DATA

METHOD FOR USING DESIGN DATA IN COMBINATION WITH INSPECTION DATA

by KHURRAM ZAFAR, PARK ALLEN, ROSE PETER, CHANG ELLIS, SAGAR KEKARE
Year of Publication 03.03.2016

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Patent

METHOD FOR USING DESIGN DATA IN COMBINATION WITH INSPECTION DATA

METHOD FOR USING DESIGN DATA IN COMBINATION WITH INSPECTION DATA

by KHURRAM ZAFAR, PARK ALLEN, ROSE PETER, CHANG ELLIS, SAGAR KEKARE
Year of Publication 21.01.2016

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Patent

METROLOGY TARGET IDENTIFICATION, DESIGN AND VERIFICATION

METROLOGY TARGET IDENTIFICATION, DESIGN AND VERIFICATION

by ADEL MICHAEL, SHUSTERMAN TAL, CHANG ELLIS, DROR CHEN
Year of Publication 17.11.2015

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Patent

METHODS AND SYSTEMS FOR UTILIZING DESIGN DATA IN COMBINATION WITH INSPECTION DATA

METHODS AND SYSTEMS FOR UTILIZING DESIGN DATA IN COMBINATION WITH INSPECTION DATA

by KHURRAM ZAFAR, PARK ALLEN, ROSE PETER, CHANG ELLIS, SAGAR KEKARE
Year of Publication 14.05.2015

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Patent

METHODS AND SYSTEMS FOR UTILIZING DESIGN DATA IN COMBINATION WITH INSPECTION DATA

METHODS AND SYSTEMS FOR UTILIZING DESIGN DATA IN COMBINATION WITH INSPECTION DATA

by KHURRAM ZAFAR, PARK ALLEN, ROSE PETER, CHANG ELLIS, SAGAR KEKARE
Year of Publication 02.04.2015

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Patent

METHODS FOR INSPECTION OF WAFERS AND RETICLES USING DESIGNER INTENT DATA

METHODS FOR INSPECTION OF WAFERS AND RETICLES USING DESIGNER INTENT DATA

by WATSON STERLING, KEKARE SAGAR A, HESS CARL, CHANG ELLIS, VOLK WILLIAM, MCCAULEY SHARON, PAUL FRANK MARELLA, WILEY JAMES
Year of Publication 11.01.2018

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Patent

DETECTING IC RELIABILITY DEFECTS

DETECTING IC RELIABILITY DEFECTS

by PARK ALLEN, BABULNATH RAGHAV, CHANG ELLIS, GAO LISHENG, WU JOANNE, KURADA SATYA
Year of Publication 01.07.2016

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Patent

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