Trap Density of States Measured by Photon Probe on Amorphous-InGaZnO Thin-Film Transistors
Chang, Youn-Gyoung, Kim, Dae-Hwan, Ko, Gunwoo, Lee, Kimoon, Kim, Jae Hoon, Im, Seongil
Published in IEEE electron device letters (01.03.2011)
Published in IEEE electron device letters (01.03.2011)
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Journal Article
DC Versus Pulse-Type Negative Bias Stress Effects on the Instability of Amorphous InGaZnO Transistors Under Light Illumination
Chang, Youn-Gyoung, Moon, Tae-Woong, Kim, Dae-Hwan, Lee, Hee Sung, Kim, Jae Hoon, Park, Kwon-shik, Kim, Chang-Dong, Im, Seongil
Published in IEEE electron device letters (01.12.2011)
Published in IEEE electron device letters (01.12.2011)
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Journal Article
Negative threshold voltage shift in an a-IGZO thin film transistor under X-ray irradiation
Kim, Dong-Gyu, Kim, Jong-Un, Lee, Jun-Sun, Park, Kwon-Shik, Chang, Youn-Gyoung, Kim, Myeong-Ho, Choi, Duck-Kyun
Published in RSC advances (03.07.2019)
Published in RSC advances (03.07.2019)
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Journal Article
Photoelectric probing of the interfacial trap density-of-states in ZnO nanowire field-effect transistors
SYED RAZA ALI RAZA, YOUNG TACK LEE, CHANG, Youn-Gyoung, PYO JIN JEON, JAE HOON KIM, HA, Ryong, CHOI, Heon-Jin, IM, Seongil
Published in Physical chemistry chemical physics : PCCP (01.01.2013)
Published in Physical chemistry chemical physics : PCCP (01.01.2013)
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Journal Article
Improvement of the Bias Instability Characteristics Driven by Organic Film in IGZO TFT for OLED Back Plane
Lim, Yubeen, Sohn, Ahrum, Kim, Jung-June, Lee, Hanseok, Ryu, Won-Sang, Chang, Youn-Gyoung, Noh, Jiyong, Park, Kwon-Shik
Published in Proceedings of the International Display Workshops (08.12.2023)
Published in Proceedings of the International Display Workshops (08.12.2023)
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Journal Article
Thin Film Transistor Substrate And Display Using The Same
KIM, MIN CHEOL, CHANG, YOUN GYOUNG, PARK, KWON SHIK, LEE, SO HYUNG, YANG, JEONG SUK
Year of Publication 29.12.2016
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Year of Publication 29.12.2016
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