Potential induced degradation of n‐type crystalline silicon solar cells with p+ front junction
Bae, Soohyun, Oh, Wonwook, Lee, Kyung Dong, Kim, Seongtak, Kim, Hyunho, Park, Nochang, Chan, Sung‐Il, Park, Sungeun, Kang, Yoonmook, Lee, Hae‐Seok, Kim, Donghwan
Published in Energy science & engineering (01.02.2017)
Published in Energy science & engineering (01.02.2017)
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반사방지막(ARC)의 SiO 2 구조에 따른 PERC 태양전지 PID 열화 완화 상관관계 연구
오경석, 박지원, 천성일, Oh, Kyoung Suk, Park, Ji Won, Chan, Sung Il
Published in Current photovoltaic research (2020)
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Published in Current photovoltaic research (2020)
Journal Article
Migration of Sn and Pb from Solder Ribbon onto Ag Fingers in Field-Aged Silicon Photovoltaic Modules
Kim, D. H., Kang, Yoonmook, Chan, SungIl, Park, N. C., Bae, Soohyun, Kim, Seongtak, Oh, W. W., Lee, Hae-Seok
Published in International Journal of Photoenergy (01.01.2015)
Published in International Journal of Photoenergy (01.01.2015)
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Analysis of degradation in 25-year-old field-aged crystalline silicon solar cells
Oh, Wonwook, Bae, Soohyun, Kim, Seongtak, Park, Nochang, Chan, Sung-Il, Choi, Hoonjoo, Hwang, Heon, Kim, Donghwan
Published in Microelectronics and reliability (01.09.2019)
Published in Microelectronics and reliability (01.09.2019)
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Field degradation prediction of potential induced degradation of the crystalline silicon photovoltaic modules based on accelerated test and climatic data
Oh, Wonwook, Bae, Soohyun, Chan, Sung-Il, Lee, Hae-Seok, Kim, Donghwan, Park, Nochang
Published in Microelectronics and reliability (01.09.2017)
Published in Microelectronics and reliability (01.09.2017)
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Journal Article
Evaluation of potential-induced degradation in crystalline Si solar cells using Na fault injection
Oh, Wonwook, Kim, Junhee, Kang, Byungjun, Bae, Soohyun, Lee, Kyung Dong, Lee, Hae-Seok, Kim, Donghwan, Chan, Sung-Il
Published in Microelectronics and reliability (01.09.2016)
Published in Microelectronics and reliability (01.09.2016)
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