Method for producing test patterns for testing an integrated circuit
CARLIN ALAN JOSEPH, CARSON HUBERT GLENN, TUMIN KENNETH PAUL, KOH ALEX S.Y
Year of Publication 07.11.2002
Get full text
Year of Publication 07.11.2002
Patent
Method for producing test patterns for testing an integrated circuit
Koh, Alex S. Y, Carlin, Alan Joseph, Tumin, Kenneth Paul, Carson, Jr, Hubert Glenn
Year of Publication 16.05.2006
Get full text
Year of Publication 16.05.2006
Patent
Method for producing test patterns for testing an integrated circuit
KOH ALEX S. Y, CARLIN ALAN JOSEPH, TUMIN KENNETH PAUL, CARSON, JR. HUBERT GLENN
Year of Publication 16.05.2006
Get full text
Year of Publication 16.05.2006
Patent