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RON Degradation Mechanisms of ON-Wafer 100-V p-GaN HEMTs Emulating Monolithically Integrated Half-Bridge Circuits
Zagni, Nicolo, Modica, Lorenzo, Cioni, Marcello, Cappellini, Giacomo, Castagna, Maria Eloisa, Giorgino, Giovanni, Iucolano, Ferdinando, Verzellesi, Giovanni, Chini, Alessandro
Published in IEEE Workshop on Wide Bandgap Power Devices and Applications (04.11.2024)
Published in IEEE Workshop on Wide Bandgap Power Devices and Applications (04.11.2024)
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