Exponential inequalities for the number of subgraphs in the Erdös–Rényi random graph
Bystrov, Alexander A., Volodko, Nadezhda V.
Published in Statistics & probability letters (01.04.2023)
Published in Statistics & probability letters (01.04.2023)
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Journal Article
ADAM: A multicenter, non-interventional, prospective cohort study for determination of prevalence of homologous recombination repair genes mutations (HRRm) in metastatic castrate-resistant prostate cancer (mCRPC)—Interim analysis
Alexeev, Boris, Lyubchenko, Liudmila, Gordiev, Marat, Filipenko, Maxim, Anzhiganova, Yulia, Sultanbaev, Alexander, Bystrov, Alexander, Orlov, Alexander, Gopp, Galina, Kopyltsov, Evgeny, Lykov, Alexander, Atduev, Vagif, Alekseeva, Galina, Mailyan, Ovsep, Semenov, Vladislav, Vedrova, Olga, Perevoschikov, Alexander, Andreev, Sergei, Evgenia, Logacheva
Published in Journal of clinical oncology (20.02.2022)
Published in Journal of clinical oncology (20.02.2022)
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Journal Article
Design and analysis of dual-rail circuits for security applications
Sokolov, D., Murphy, J., Bystrov, A., Yakovlev, A.
Published in IEEE transactions on computers (01.04.2005)
Published in IEEE transactions on computers (01.04.2005)
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Journal Article
Direct Mapping of Low-Latency Asynchronous Controllers From STGs
Sokolov, D., Bystrov, A., Yakovlev, A.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.06.2007)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.06.2007)
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Journal Article
Phase-Encoding for On-Chip Signalling
D'Alessandro, C.S., Delong Shang, Bystrov, A., Yakovlev, A.V., Maevsky, O.
Published in IEEE transactions on circuits and systems. I, Regular papers (01.03.2008)
Published in IEEE transactions on circuits and systems. I, Regular papers (01.03.2008)
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Journal Article
On-line testing of bundled-data asynchronous handshake protocols
Zeidler, Steffen, Bystrov, Alexander, Krstic, Milos, Kraemer, Rolf
Published in 2010 IEEE 16th International On-Line Testing Symposium (01.07.2010)
Published in 2010 IEEE 16th International On-Line Testing Symposium (01.07.2010)
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Conference Proceeding