Resistance and Threshold Switching Voltage Drift Behavior in Phase-Change Memory and Their Temperature Dependence at Microsecond Time Scales Studied Using a Micro-Thermal Stage
SangBum Kim, Byoungil Lee, Asheghi, Mehdi, Hurkx, Fred, Reifenberg, John P, Goodson, Kenneth E, Wong, H.-S Philip
Published in IEEE transactions on electron devices (01.03.2011)
Published in IEEE transactions on electron devices (01.03.2011)
Get full text
Journal Article
Integration of Nanoelectromechanical Relays With Silicon nMOS
Soogine Chong, Byoungil Lee, Mitra, Subhasish, Howe, Roger T., Wong, H.-S Philip
Published in IEEE transactions on electron devices (01.01.2012)
Published in IEEE transactions on electron devices (01.01.2012)
Get full text
Journal Article
Effect of Resistance Drift on the Activation Energy for Crystallization in Phase Change Memory
Ahn, Chiyui, Lee, Byoungil, Jeyasingh, Rakesh G. D, Asheghi, Mehdi, Hurkx, Fred, Goodson, Kenneth E, Wong, H.-S. Philip
Published in Japanese Journal of Applied Physics (01.02.2012)
Published in Japanese Journal of Applied Physics (01.02.2012)
Get full text
Journal Article
Effect of Resistance Drift on the Activation Energy for Crystallization in Phase Change Memory
Ahn, Chiyui, Lee, Byoungil, Jeyasingh, Rakesh G. D., Asheghi, Mehdi, Hurkx, Fred, Goodson, Kenneth E., Wong, H.-S. Philip
Published in Japanese Journal of Applied Physics (01.02.2012)
Published in Japanese Journal of Applied Physics (01.02.2012)
Get full text
Journal Article
Thermal disturbance and its impact on reliability of phase-change memory studied by the micro-thermal stage
SangBum Kim, Byoungil Lee, Asheghi, M, Hurkx, G A M, Reifenberg, J, Goodson, K, Wong, H P
Published in 2010 IEEE International Reliability Physics Symposium (01.01.2010)
Published in 2010 IEEE International Reliability Physics Symposium (01.01.2010)
Get full text
Conference Proceeding
Low-power TiN/Al2O3/Pt resistive switching device with sub-20 μA switching current and gradual resistance modulation
Wu, Yi, Yu, Shimeng, Lee, Byoungil, Wong, Philip
Published in Journal of applied physics (01.11.2011)
Published in Journal of applied physics (01.11.2011)
Get full text
Journal Article
Metal-Oxide RRAM
Wong, H.-S. Philip, Lee, Heng-Yuan, Yu, Shimeng, Chen, Yu-Sheng, Wu, Yi, Chen, Pang-Shiu, Lee, Byoungil, Chen, Frederick T., Tsai, Ming-Jinn
Published in Proceedings of the IEEE (01.06.2012)
Published in Proceedings of the IEEE (01.06.2012)
Get full text
Journal Article
Nanoelectronic Programmable Synapses Based on Phase Change Materials for Brain-Inspired Computing
Kuzum, Duygu, Jeyasingh, Rakesh G. D, Lee, Byoungil, Wong, H.-S. Philip
Published in Nano letters (09.05.2012)
Published in Nano letters (09.05.2012)
Get full text
Journal Article
Fabrication and characterization of emerging nanoscale memory
SangBum Kim, Yuan Zhang, Byoungil Lee, Caldwell, M., Wong, H.-S.P.
Published in 2009 IEEE International Symposium on Circuits and Systems (ISCAS) (01.05.2009)
Published in 2009 IEEE International Symposium on Circuits and Systems (ISCAS) (01.05.2009)
Get full text
Conference Proceeding
Ultra-low power Al2O3-based RRAM with 1μA reset current
Yi Wu, Byoungil Lee, Wong, H P
Published in Proceedings of 2010 International Symposium on VLSI Technology, System and Application (01.04.2010)
Published in Proceedings of 2010 International Symposium on VLSI Technology, System and Application (01.04.2010)
Get full text
Conference Proceeding
Integration of nanoelectromechanical (NEM) relays with silicon CMOS with functional CMOS-NEM circuit
Soogine Chong, Byoungil Lee, Parizi, K. B., Provine, J., Mitra, S., Howe, R. T., Wong, H. P.
Published in 2011 International Electron Devices Meeting (01.12.2011)
Published in 2011 International Electron Devices Meeting (01.12.2011)
Get full text
Conference Proceeding
Crystallization properties and their drift dependence in phase-change memory studied with a micro-thermal stage
Ahn, Chiyui, Lee, Byoungil, Jeyasingh, Rakesh G. D., Asheghi, Mehdi, Hurkx, G. A. M., Goodson, Kenneth E., Philip Wong, H.-S.
Published in Journal of applied physics (01.12.2011)
Published in Journal of applied physics (01.12.2011)
Get full text
Journal Article
Highly Manufacturable 7th Generation 3D NAND Flash Memory with COP structure and Double Stack Process
Kim, Jun Hyoung, Yim, Yongsik, Lim, Joonsung, Kim, Hyun Suk, Suk Cho, Eun, Yeo, Chadong, Lee, Woongseop, You, Byungkwan, Lee, Byoungil, Kang, Minkyu, Jang, Woojae, Kwon, Youngho, Lee, Keehong, Lee, Jaeduk, Kim, Myeong-Cheol, Lee, Jin-Yub, Hur, Sunghoi, Ahn, Su Jin, Hong, Hyeongsun, Shin, Yu Gyun, Kim, Hyoung-Sub, Song, Jaihyuk
Published in 2021 Symposium on VLSI Technology (13.06.2021)
Get full text
Published in 2021 Symposium on VLSI Technology (13.06.2021)
Conference Proceeding