by Butler, K.M., Saxena, J., Jain, A., Fryars, T., Lewis, J., Hetherington, G.
Published in 2004 International Conferce on Test (2004)

by Saxena, J., Butler, K.M., Gatt, J., Raghuraman, R., Kumar, S.P., Basu, S., Campbell, D.J., Berech, J.
Published in Proceedings - International Test Conference (2002)

by Saxena, J., Butler, K.M., Whetsel, L.
Published in Proceedings International Test Conference 2001 (Cat. No.01CH37260) (2001)

by Duncan, Christopher J A, Mohamad, Siti M B, Young, Dan F, Skelton, Andrew J, Leahy, T Ronan, Munday, Diane C, Butler, Karina M, Morfopoulou, Sofia, Brown, Julianne R, Hubank, Mike, Connell, Jeff, Gavin, Patrick J, McMahon, Cathy, Dempsey, Eugene, Lynch, Niamh E, Jacques, Thomas S, Valappil, Manoj, Cant, Andrew J, Breuer, Judith, Engelhardt, Karin R, Randall, Richard E, Hambleton, Sophie
Published in Science translational medicine (30.09.2015)

by Urquhart, S A, Bendo, G J, Serjeant, S, Bakx, T, Hagimoto, M, Cox, P, Neri, R, Lehnert, M, Sedgwick, C, Weiner, C, Dannerbauer, H, Amvrosiadis, A, Andreani, P, Baker, A J, Beelen, A, Berta, S, Borsato, E, Buat, V, Butler, K M, Cooray, A, De Zotti, G, Dunne, L, Dye, S, Eales, S, Enia, A, Fan, L, Gavazzi, R, González-Nuevo, J, Harris, A I, Herrera, C N, Hughes, D, Ismail, D, Ivison, R, Jin, S, Jones, B, Kohno, K, Krips, M, Lagache, G, Marchetti, L, Massardi, M, Messias, H, Negrello, M, Omont, A, Perez-Fournon, I, Riechers, D A, Scott, D, Smith, M W L, Stanley, F, Tamura, Y, Temi, P, Vlahakis, C, Weiß, A, van der Werf, P, Verma, A, Yang, C, Young, A J
Published in Monthly notices of the Royal Astronomical Society (16.02.2022)

by Butler, K.M.
Published in IEEE design & test of computers (01.09.2006)

by Ahmed, Nisar, Tehranipoor, Mohammad, Ravikumar, C. P., Butler, Kenneth M.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.05.2007)

by Saxena, J., Butler, K.M., Jayaram, V.B., Kundu, S., Arvind, N.V., Sreeprakash, P., Hachinger, M.
Published in International Test Conference, 2003. Proceedings. ITC 2003 (2003)

by Butler, K.M., Carulli, J.M., Saxena, J., Nahar, A., Daasch, W.R.
Published in IEEE design & test of computers (01.09.2009)

by Hsu, F.F., Butler, K.M., Patel, J.H.
Published in Proceedings International Test Conference 2001 (Cat. No.01CH37260) (2001)

by Butler, K.M.
Published in 2007 IEEE International Test Conference (01.10.2007)

by Nahar, A., Butler, K.M., Carulli, J.M., Weinberger, C.
Published in 2009 IEEE International Conference on Computer Design (01.10.2009)

by Kashiwagi, Takashi, Gilman, Jeffrey W., Butler, Kathryn M., Harris, Richard H., Shields, John R., Asano, Atsushi
Published in Fire and materials (01.11.2000)

by Dworak, J., Wicker, J.D., Lee, S., Grimaila, M.R., Mercer, M.R., Butler, K.M., Stewart, B., Wang, L.-C.
Published in IEEE design & test of computers (01.01.2001)

by Butler, K.M., Kwang-Ting Cheng, Wang, L.-C.
Published in IEEE design & test of computers (01.09.2003)

by Butler, K.M., Carulli, J.M., Saxena, J.
Published in 2008 IEEE International Test Conference (01.10.2008)

by Butler, K.M.
Published in Journal of the European Academy of Dermatology and Venereology (01.09.1997)

by Butler, K.M., Subramaniam, S., Nahar, A., Carulli, J.M., Anderson, T.J., Daasch, W.R.
Published in 2006 IEEE International Reliability Physics Symposium Proceedings (01.03.2006)

by Tehranipoor, M., Butler, K.M.
Published in IEEE design & test of computers (01.03.2010)

by Butler, K.M.
Published in 2004 International Conferce on Test (2004)