by Chuang, Kai-Hsin, Bury, Erik, Degraeve, Robin, Kaczer, Ben, Linten, Dimitri, Verbauwhede, Ingrid
Published in IEEE journal of solid-state circuits (01.10.2019)

by Diaz-Fortuny, Javier, Saraza-Canflanca, Pablo, Bury, Erik, Degraeve, Robin, Kaczer, Ben
Published in Micromachines (Basel) (08.06.2024)

by Tyaginov, Stanislav, Bury, Erik, Grill, Alexander, Yu, Zhuoqing, Makarov, Alexander, De Keersgieter, An, Vexler, Mikhail, Vandemaele, Michiel, Wang, Runsheng, Spessot, Alessio, Chasin, Adrian, Kaczer, Ben
Published in Micromachines (Basel) (01.11.2023)

by Hiltbrunner, Andreas, Viczián, András, Bury, Erik, Tscheuschler, Anke, Kircher, Stefan, Tóth, Réka, Honsberger, Ariane, Nagy, Ferenc, Fankhauser, Christian, Schäfer, Eberhard
Published in Current biology (06.12.2005)

by Makarov, Alexander, Roussel, Philippe, Bury, Erik, Vandemaele, Michiel, Spessot, Alessio, Linten, Dimitri, Kaczer, Ben, Tyaginov, Stanislav
Published in Micromachines (Basel) (30.06.2020)

by Marrocco, Katia, Zhou, Yongchun, Bury, Erik, Dieterle, Monika, Funk, Markus, Genschik, Pascal, Krenz, Martina, Stolpe, Thorsten, Kretsch, Thomas
Published in The Plant journal : for cell and molecular biology (01.02.2006)

by Gil, Patricia, Kircher, Stefan, Adam, Eva, Bury, Erik, Kozma‐Bognar, Laszlo, Schäfer, Eberhard, Nagy, Ferenc
Published in The Plant journal : for cell and molecular biology (01.04.2000)

by Gupta, Charu, Gupta, Anshul, Tuli, Shikhar, Bury, Erik, Parvais, Bertrand, Dixit, Abhisek
Published in IEEE transactions on electron devices (01.01.2020)

by Diaz-Fortuny, Javier, Saraza-Canflanca, Pablo, Romano-Molar, Alex, Bury, Erik, Degraeve, Robin, Kaczer, Ben
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)

by Diaz-Fortuny, Javier, Sangani, Dishant, Saraza-Canflanca, Pablo, Bury, Erik, Degraeve, Robin, Kaczer, Ben
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)

by Diaz-Fortuny, Javier, Saraza-Canflanca, Pablo, Bury, Erik, Vandemaele, Michiel, Kaczer, Ben, Degraeve, Robin
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)

by Lee, Kookjin, Choi, Junhee, Kaczer, Ben, Grill, Alexander, Lee, Jae Woo, Van Beek, Simon, Bury, Erik, Diaz‐Fortuny, Javier, Chasin, Adrian, Lee, Jaewoo, Chun, Jungu, Shin, Dong Hoon, Na, Junhong, Cho, Hyeran, Lee, Sang Wook, Kim, Gyu‐Tae
Published in Advanced functional materials (01.06.2021)

by Lee, Kookjin, Choi, Junhee, Kaczer, Ben, Grill, Alexander, Lee, Jae Woo, Van Beek, Simon, Bury, Erik, Diaz‐Fortuny, Javier, Chasin, Adrian, Lee, Jaewoo, Chun, Jungu, Shin, Dong Hoon, Cho, Hyeran, Lee, Sang Wook, Kim, Gyu‐Tae
Published in Advanced functional materials (01.06.2021)

by Makarov, Alexander, Kaczer, Ben, Chasin, Adrian, Vandemaele, Michiel, Bury, Erik, Jech, Markus, Grill, Alexander, Hellings, Geert, El-Sayed, Al-Moatasem, Grasser, Tibor, Linten, Dimitri, Tyaginov, Stanislav
Published in IEEE electron device letters (01.10.2019)

by Vandemaele, Michiel, Kaczer, Ben, Tyaginov, Stanislav, Bury, Erik, Chasin, Adrian, Franco, Jacopo, Makarov, Alexander, Mertens, Hans, Hellings, Geert, Groeseneken, Guido
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)

by Catapano, Edoardo, Grill, Alexander, Canflanca, Pablo Saraza, Fortuny, Javier Diaz, Bury, Erik, Chasin, Adrian, Kaczer, Ben, Greve, Kristiaan de, Afanasiev, Valeri
Published in 2024 IEEE European Solid-State Electronics Research Conference (ESSERC) (09.09.2024)

by Vandemaele, Michiel, Chuang, Kai-Hsin, Bury, Erik, Tyaginov, Stanislav, Groeseneken, Guido, Kaczer, Ben
Published in 2020 IEEE International Reliability Physics Symposium (IRPS) (01.04.2020)

by Vandemaele, Michiel, Kaczer, Ben, Bury, Erik, Franco, Jacopo, Chasin, Adrian, Makarov, Alexander, Mertens, Hans, Hellings, Geert, Groeseneken, Guido
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)

by Vandemaele, Michiel, Kaczer, Ben, Tyaginov, Stanislav, Stanojevic, Zlatan, Makarov, Alexander, Chasin, Adrian, Bury, Erik, Mertens, Hans, Linten, Dimitri, Groeseneken, Guido
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)

by Wu, Zhicheng, Franco, Jacopo, Truijen, Brecht, Roussel, Philippe, Tyaginov, Stanislav, Vandemaele, Michiel, Bury, Erik, Groeseneken, Guido, Linten, Dimitri, Kaczer, Ben
Published in 2021 IEEE International Reliability Physics Symposium (IRPS) (01.03.2021)