by Perez, Miguel E., Sperling, Michael A., Bulzacchelli, John F., Toprak-Deniz, Zeynep, Diemoz, Timothy E.
Published in IEEE journal of solid-state circuits (01.03.2020)

by Chakraborty, Sudipto, Frank, David J., Tien, Kevin, Rosno, Pat, Yeck, Mark, Glick, Joseph A., Robertazzi, Raphael, Richetta, Ray, Bulzacchelli, John F., Underwood, Devin, Ramirez, Daniel, Yilma, Dereje, Davies, Andrew, Joshi, Rajiv V., Chambers, Shawn D., Lekuch, Scott, Inoue, Ken, Wisnieff, Dorothy, Baks, Christian W., Bethune, Donald S., Timmerwilke, John, Fox, Thomas, Song, Peilin, Johnson, Blake R., Gaucher, Brian P., Friedman, Daniel J.
Published in IEEE journal of solid-state circuits (01.11.2022)

by Toprak-Deniz, Zeynep, Proesel, Jonathan E., Bulzacchelli, John F., Ainspan, Herschel A., Dickson, Timothy O., Beakes, Michael P., Meghelli, Mounir
Published in IEEE journal of solid-state circuits (01.01.2020)

by Proesel, Jonathan E., Toprak-Deniz, Zeynep, Cevrero, Alessandro, Ozkaya, Ilter, Kim, Seongwon, Kuchta, Daniel M., Lee, Sungjae, Rylov, Sergey V., Ainspan, Herschel, Dickson, Timothy O., Bulzacchelli, John F., Meghelli, Mounir
Published in IEEE journal of solid-state circuits (01.04.2018)

by Dickson, Timothy O., Deniz, Zeynep Toprak, Cochet, Martin, Beukema, Troy J., Kossel, Marcel, Morf, Thomas, Choi, Young-Ho, Francese, Pier Andrea, Brandli, Matthias, Baks, Christian W., Proesel, Jonathan E., Bulzacchelli, John F., Beakes, Michael P., Yoo, Byoung-Joo, Ahn, Hyoungbae, Lim, Dong-Hyuk, Kang, Gunil, Park, Sang-Hune, Meghelli, Mounir, Rhew, Hyo Gyuem, Friedman, Daniel J., Choi, Michael, Soyuer, Mehmet, Shin, Jongshin
Published in IEEE journal of solid-state circuits (01.04.2023)

by Toprak-Deniz, Zeynep, Proesel, Jonathan E., Bulzacchelli, John F., Ainspan, Herschel A., Dickson, Timothy O., Beakes, Michael P., Meghelli, Mounir
Published in IEEE journal of solid-state circuits (01.04.2020)

by Rylyakov, Alexander, Proesel, Jonathan E., Rylov, Sergey, Lee, Benjamin G., Bulzacchelli, John F., Ardey, Abhijeet, Parker, Ben, Beakes, Michael, Baks, Christian W., Schow, Clint L., Meghelli, Mounir
Published in IEEE journal of solid-state circuits (01.12.2015)

by Bulzacchelli, J. F., Menolfi, C., Beukema, T. J., Storaska, D. W., Hertle, J., Hanson, D. R., Ping-Hsuan Hsieh, Rylov, S. V., Furrer, D., Gardellini, D., Prati, A., Morf, T., Sharma, V., Kelkar, R., Ainspan, H. A., Kelly, W. R., Chieco, L. R., Ritter, G. A., Sorice, J. A., Garlett, J. D., Callan, R., Brandli, M., Buchmann, P., Kossel, M., Toifl, T., Friedman, D. J.
Published in IEEE journal of solid-state circuits (01.12.2012)

by Agrawal, A., Bulzacchelli, J. F., Dickson, T. O., Liu, Y., Tierno, J. A., Friedman, D. J.
Published in IEEE journal of solid-state circuits (01.12.2012)

by Bulzacchelli, J. F., Toprak-Deniz, Z., Rasmus, T. M., Iadanza, J. A., Bucossi, W. L., Seongwon Kim, Blanco, R., Cox, C. E., Chhabra, M., LeBlanc, C. D., Trudeau, C. L., Friedman, D. J.
Published in IEEE journal of solid-state circuits (01.04.2012)

by Frank, David J., Chakraborty, Sudipto, Tien, Kevin, Rosno, Pat, Fox, Thomas, Yeck, Mark, Glick, Joseph A., Robertazzi, Raphael, Richetta, Ray, Bulzacchelli, John F., Ramirez, Daniel, Yilma, Dereje, Davies, Andrew, Joshi, Rajiv V., Chambers, Shawn D., Lekuch, Scott, Inoue, Ken, Underwood, Devin, Wisnieff, Dorothy, Baks, Chris, Bethune, Donald, Timmerwilke, John, Johnson, Blake R., Gaucher, Brian P., Friedman, Daniel J.
Published in 2022 IEEE International Solid- State Circuits Conference (ISSCC) (20.02.2022)

by Dickson, T. O., Yong Liu, Rylov, S. V., Bing Dang, Tsang, C. K., Andry, P. S., Bulzacchelli, J. F., Ainspan, H. A., Xiaoxiong Gu, Turlapati, L., Beakes, M. P., Parker, B. D., Knickerbocker, J. U., Friedman, D. J.
Published in IEEE journal of solid-state circuits (01.04.2012)

by Bulzacchelli, J.F., Meghelli, M., Rylov, S.V., Rhee, W., Rylyakov, A.V., Ainspan, H.A., Parker, B.D., Beakes, M.P., Aichin Chung, Beukema, T.J., Pepeljugoski, P.K., Shan, L., Kwark, Y.H., Gowda, S., Friedman, D.J.
Published in IEEE journal of solid-state circuits (01.12.2006)

by Dickson, T.O., Bulzacchelli, J.F., Friedman, D.J.
Published in IEEE journal of solid-state circuits (01.04.2009)

by Frank, David J., Chakraborty, Sudipto, Tien, Kevin, Rosno, Pat, Yeck, Mark, Glick, Joseph A., Robertazzi, Raphael, Richetta, Ray, Bulzacchelli, John F., Ramirez, Daniel, Yilma, Dereje, Davies, Andrew, Joshi, Rajiv V., Lekuch, Scott, Inoue, Ken, Underwood, Devin, Wisnieff, Dorothy, Baks, Chris, Timmerwilke, John, Song, Peilin, Johnson, Blake R., Gaucher, Brian P., Friedman, Daniel J.
Published in 2023 IEEE Custom Integrated Circuits Conference (CICC) (01.04.2023)

by Yonar, A. Serdar, Francese, Pier Andrea, Brandli, Matthias, Kossel, Marcel, Morf, Thomas, Proesel, Jonathan E., Rylov, Sergey, Ainspan, Herschel, Cochet, Martin, Deniz, Zeynep, Dickson, Timothy, Beukema, Troy, Baks, Christian, Beakes, Michael, Bulzacchelli, John F., Choi, Young-Ho, Yoo, Byoung-Joo, Ahn, Hyoungbae, Lim, Dong-Hyuk, Kang, Gunil, Park, Sang-Hune, Meghelli, Mounir, Rhew, Hyo-Gyuem, Friedman, Daniel, Choi, Michael, Soyuer, Mehmet, Shin, Jongshin
Published in 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (12.06.2022)

by Dickson, Timothy O., Liu, Yong, Agrawal, Ankur, Bulzacchelli, John F., Ainspan, Herschel A., Toprak-Deniz, Zeynep, Parker, Benjamin D., Beakes, Michael P., Meghelli, Mounir, Friedman, Daniel J.
Published in IEEE journal of solid-state circuits (01.08.2016)

by Gangasani, G. R., Chun-Ming Hsu, Bulzacchelli, J. F., Rylov, S., Beukema, T., Freitas, D., Kelly, W., Shannon, M., Jieming Qi, Xu, H. H., Natonio, J., Rasmus, T., Jong-Ru Guo, Wielgos, M., Garlett, J., Sorna, M. A., Meghelli, M.
Published in IEEE journal of solid-state circuits (01.08.2012)

by Tien, Kevin, Inoue, Ken, Lekuch, Scott, Frank, David J., Chakraborty, Sudipto, Rosno, Pat, Fox, Thomas, Yeck, Mark, Glick, Joseph A., Robertazzi, Raphael, Richetta, Ray, Bulzacchelli, John F., Ramirez, Daniel, Yilma, Dereje, Davies, Andrew, Joshi, Rajiv V., Underwood, Devin, Wisnieff, Dorothy, Baks, Chris, Bethune, Donald, Timmerwilke, John, Johnson, Blake R., Gaucher, Brian P., Friedman, Daniel J.
Published in 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE) (14.03.2022)

by Emami-Neyestanak, Azita, Varzaghani, Aida, Bulzacchelli, John F., Rylyakov, Alexander, Yang, Chih-Kong Ken, Friedman, Daniel J.
Published in IEEE journal of solid-state circuits (01.04.2007)