Normalized differential conductivity and surface density of states in simulated tunneling spectroscopy
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Structural defects of the Si(111)√3×√3-B surface studied by scanning tunneling microscopy
Zotov, A.V., Kulakov, M.A., Ryzhkov, S.V., Saranin, A.A., Lifshits, V.G., Bullemer, B., Eisele, I.
Published in Surface science (01.01.1996)
Published in Surface science (01.01.1996)
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Stepped morphology on 4H and 15R silicon carbide: modelling by a random walk
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An ultra-high resolution control unit for a scanning tunnelling microscope
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Scanning tunnelling microscopy on quenched Si(111) surfaces
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Modelling of pattern growth by vacancy diffusion and trapping on Si(111)7 × 7 surface
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Delta-doped MESFET with MBE-grown Si
ZEINDL, H. P, BULLEMER, B, EISELE, I, TEMPEL, G
Published in Journal of the Electrochemical Society (01.04.1989)
Published in Journal of the Electrochemical Society (01.04.1989)
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