Comprehensive Modeling and Characterization of Photon Detection Efficiency and Jitter Tail in Advanced SPAD Devices
Helleboid, Remi, Rideau, Denis, Grebot, Jeremy, Nicholson, Isobel, Moussy, Norbert, Saxod, Olivier, Basset, Marie, Zimmer, Antonin, Mamdy, Bastien, Golanski, Dominique, Agnew, Megan, Pellegrini, Sara, Sicre, Mathieu, Buj, Christel, Marchand, Guillaume, Saint-Martin, Jerome, Pala, Marco, Dollfus, Philippe
Published in IEEE journal of the Electron Devices Society (2022)
Published in IEEE journal of the Electron Devices Society (2022)
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Journal Article
Dark Count Rate in Single-Photon Avalanche Diodes: Characterization and Modeling study
Sicre, Mathieu, Agnew, Megan, Buj, Christel, Coignus, Jean, Golanski, Dominique, Helleboid, Remi, Mamdy, Bastien, Nicholson, Isobel, Pellegrini, Sara, Rideau, Denis, Roy, David, Calmon, Francis
Published in ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC) (13.09.2021)
Published in ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC) (13.09.2021)
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Conference Proceeding
Dark Count Rate in Single-Photon Avalanche Diodes: Characterization and Modeling study
Sicre, Mathieu, Agnew, Megan, Buj, Christel, Coignus, Jean, Golanski, Dominique, Helleboid, Remi, Mamdy, Bastien, Nicholson, Isobel, Pellegrini, Sara, Rideau, Denis, Roy, David, Calmon, Francis
Published in ESSCIRC 2021 - IEEE 47th European Solid State Circuits Conference (ESSCIRC) (13.09.2021)
Published in ESSCIRC 2021 - IEEE 47th European Solid State Circuits Conference (ESSCIRC) (13.09.2021)
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Conference Proceeding
Experimental investigation of ESD design window for fully depleted SOI N-MOSFETs
Benoist, Thomas, Fenouillet-Beranger, Claire, Perreau, Pierre, Buj, Christel, Galy, Philippe, Marin-Cudraz, David, Faynot, Olivier, Cristoloveanu, Sorin, Gentil, Pierre
Published in Microelectronic engineering (01.07.2011)
Published in Microelectronic engineering (01.07.2011)
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Journal Article
Conference Proceeding
High frequency performance of sub-100 nm UTB-FDSOI featuring TiN/HfO2 gate stack: Special Issue with Papers Selected from the Ultimate Integration on Silicon Conference, Ulis 2008
TAO CHUAN LIM, ROZEAU, Olivier, BUJ, Christel, PACCAUD, Michel, LEPILLIET, Sylvie, DAMBRINE, Gilles, DANNEVILLE, Francois
Published in Solid-state electronics (2009)
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Published in Solid-state electronics (2009)
Journal Article
High frequency performance of sub-100 nm UTB-FDSOI featuring TiN/HfO2 gate stack
Lim, T.C., Rozeau, O., Buj, C., Paccaud, M., Lepilliet, Sylvie, Dambrine, Gilles, Danneville, Francois
Published in Solid-state electronics (01.04.2009)
Published in Solid-state electronics (01.04.2009)
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Journal Article
Statistical measurements and Monte-Carlo simulations of DCR in SPADs
Sicre, Mathieu, Agnew, Megan, Buj, Christel, Coutier, Caroline, Golanski, Dominique, Helleboid, Remi, Mamdy, Bastien, Nicholson, Isobel, Pellegrini, Sara, Rideau, Denis, Roy, David, Calmon, Francis
Published in ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC) (19.09.2022)
Published in ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC) (19.09.2022)
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Conference Proceeding
ESD robustness of FDSOI gated diode for ESD network design: Thin or thick BOX?
Benoist, Thomas, Fenouillet-Beranger, Claire, Perreau, Pierre, Buj, Christel, Galy, Philippe, Marin-Cudraz, David, Faynot, Olivier, Cristoloveanu, Sorin, Gentil, Pierre
Published in 2010 IEEE International SOI Conference (SOI) (01.10.2010)
Published in 2010 IEEE International SOI Conference (SOI) (01.10.2010)
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Conference Proceeding
Ultra Compact FDSOI Transistors including Strain and Orientation: Processing and Performance
Fenouillet-Beranger, Claire, Pham Nguyen, Loan, Perreau, Pierre, Denorme, Stephane, Andrieu, Francois, Faynot, Olivier, Tosti, Lucie, Brevard, Laurent, Buj, Christel, Weber, Olivier, Gallon, Claire, Fiori, V., Boeuf, Frederic, Cristoloveanu, S., Skotnicki, Thomas
Published in ECS transactions (15.05.2009)
Published in ECS transactions (15.05.2009)
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Journal Article
Analog/RF Performance of Multichannel SOI MOSFET
Tao Chuan Lim, Bernard, E., Rozeau, O., Ernst, T., Guillaumot, B., Vulliet, N., Buj-Dufournet, C., Paccaud, M., Lepilliet, S., Dambrine, G., Danneville, F.
Published in IEEE transactions on electron devices (01.07.2009)
Published in IEEE transactions on electron devices (01.07.2009)
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Journal Article
High Scalability and Low Variability of Planar Fully Depleted SOI MOSFETs
Weber, Olivier, Andrieu, Francois, Fenouillet-Béranger, Claire, Buj-Dufournet, Christel, Barral, Vincent, Perreau, Pierre, Tosti, Lucie, Brevard, Laurent, Faynot, Olivier
Published in ECS transactions (10.07.2009)
Published in ECS transactions (10.07.2009)
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Journal Article
Improved ESD protection in advanced FDSOI by using hybrid SOI/bulk Co-integration
Benoist, T, Fenouillet-Beranger, C, Guitard, N, Huguenin, J.-L, Monfray, S, Galy, P, Buj, C, Andrieu, F, Perreau, P, Marin-Cudraz, D, Faynot, O, Cristoloveanu, S, Gentil, P
Published in Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2010 (01.10.2010)
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Published in Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2010 (01.10.2010)
Conference Proceeding
Ultra compact FDSOI transistors (including Strain and orientation) processing and performance
Fenouillet-Beranger, Claire, Pham Nguyen, Loan, Perreau, Pierre, Denorme, Stephane, Andrieu, Francois, Faynot, Olivier, Brevard, Laurent, Tosti, Lucie, Buj, Christel, Weber, Olivier, Gallon, Claire, Boeuf, Frederic, Cristoloveanu, S., Skotnicki, Thomas
Published in Meeting abstracts (Electrochemical Society) (01.05.2009)
Published in Meeting abstracts (Electrochemical Society) (01.05.2009)
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Journal Article