Verilog-A model for avalanche dynamics and quenching in Single-Photon Avalanche Diodes
oussaiti, Y., Rideau, D., Manouvrier, J.R., Quenette, V., Mamdy, B., Buj, C., Grebot, J., Wehbe-Alause, H., Lopez, A., Mugny, G., Agnew, M., Lacombe, E., Pala, M., Dollfus, P.
Published in 2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (23.09.2020)
Published in 2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (23.09.2020)
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Conference Proceeding
FDSOI devices with thin BOX and ground plane integration for 32 nm node and below
Fenouillet-Beranger, C., Denorme, S., Perreau, P., Buj, C., Faynot, O., Andrieu, F., Tosti, L., Barnola, S., Salvetat, T., Garros, X., Cassé, M., Allain, F., Loubet, N., Pham-Nguyen, L., Deloffre, E., Gros-Jean, M., Beneyton, R., Laviron, C., Marin, M., Leyris, C., Haendler, S., Leverd, F., Gouraud, P., Scheiblin, P., Clement, L., Pantel, R., Deleonibus, S., Skotnicki, T.
Published in Solid-state electronics (01.07.2009)
Published in Solid-state electronics (01.07.2009)
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Speckle-based off-axis holographic detection for non-contact photoacoustic tomography
Buj, C., Horstmann, J., Münter, M., Brinkmann, R.
Published in Current directions in biomedical engineering (01.09.2015)
Published in Current directions in biomedical engineering (01.09.2015)
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Simulation in action: the application of modelling to SPAD architecture design
Pellegrini, S., Nicholson, I., Helleboid, R., Mamdy, B., Forcolin, G., Al-Rawhani, M., Buj, C., Marchand, G., Rae, B., Golanski, D., Mugny, G., Bianchi, R. A., Rideau, D.
Published in 2023 International Electron Devices Meeting (IEDM) (09.12.2023)
Published in 2023 International Electron Devices Meeting (IEDM) (09.12.2023)
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Conference Proceeding
Analog/RF Performance of Multichannel SOI MOSFET
Tao Chuan Lim, Bernard, E., Rozeau, O., Ernst, T., Guillaumot, B., Vulliet, N., Buj-Dufournet, C., Paccaud, M., Lepilliet, S., Dambrine, G., Danneville, F.
Published in IEEE transactions on electron devices (01.07.2009)
Published in IEEE transactions on electron devices (01.07.2009)
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Journal Article
Dark Count Rate in Single-Photon Avalanche Diodes: Characterization and Modeling study
Sicre, Mathieu, Agnew, Megan, Buj, Christel, Coignus, Jean, Golanski, Dominique, Helleboid, Remi, Mamdy, Bastien, Nicholson, Isobel, Pellegrini, Sara, Rideau, Denis, Roy, David, Calmon, Francis
Published in ESSCIRC 2021 - IEEE 47th European Solid State Circuits Conference (ESSCIRC) (13.09.2021)
Published in ESSCIRC 2021 - IEEE 47th European Solid State Circuits Conference (ESSCIRC) (13.09.2021)
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Conference Proceeding
Direct Measurements and Modeling of Avalanche Dynamics and Quenching in SPADs
Rideau, D., Uhring, W., Bianchi, R. A., Helleboid, R., Mugny, G., Grebot, J., Manouvrier, J.R., Neri, R., Brun, F., Lakeh, M. Dolatpoor, Rink, S., Kammerer, J-B., Lallement, C., Lacombe, E., Golanski, D., Rae, B., Bah, T. M., Twaddle, F., Quenette, V., Marchand, G., Buj, C., Fillon, R., Henrion, Y., Nicholson, I., Agnew, M., Basset, M., Perrier, R., Al-Rawhani, M., Mamdy, B., Pellegrin, S., Gouget, G., Maciazek, P., Juge, A., Dartigues, A., Alause, H. Wehbe
Published in ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC) (11.09.2023)
Published in ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC) (11.09.2023)
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Conference Proceeding
High immunity to threshold voltage variability in undoped ultra-thin FDSOI MOSFETs and its physical understanding
Weber, O., Faynot, O., Andrieu, F., Buj-Dufournet, C., Allain, F., Scheiblin, P., Foucher, J., Daval, N., Lafond, D., Tosti, L., Brevard, L., Rozeau, O., Fenouillet-Beranger, C., Marin, M., Boeuf, F., Delprat, D., Bourdelle, K., Nguyen, B.-Y., Deleonibus, S.
Published in 2008 IEEE International Electron Devices Meeting (01.12.2008)
Published in 2008 IEEE International Electron Devices Meeting (01.12.2008)
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Use of Electrothermal Simulation to Analyze Thermal Breakdown on N+/P/P+ Diode During ESD Pulse
Buj, C., Leroux, C., Chante, J.-P
Published in ESSDERC '93: 23rd European solid State Device Research Conference (01.09.1993)
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Published in ESSDERC '93: 23rd European solid State Device Research Conference (01.09.1993)
Conference Proceeding
High frequency performance of sub-100 nm UTB-FDSOI featuring TiN/HfO2 gate stack
Lim, T.C., Rozeau, O., Buj, C., Paccaud, M., Lepilliet, Sylvie, Dambrine, Gilles, Danneville, Francois
Published in Solid-state electronics (01.04.2009)
Published in Solid-state electronics (01.04.2009)
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Journal Article
FDSOI devices with thin BOX and ground plane integration for 32nm node and below
Fenouillet-Beranger, C., Denorme, S., Perreau, P., Buj, C., Faynot, O., Andrieu, F., Tosti, L., Barnola, S., Salvetat, T., Garros, X., Cassé, M., Allain, F., Loubet, N., Pham-Nguyen, L., Deloffre, E., Gros-Jean, M., Beneyton, R., Laviron, C., Marin, M., Leyris, C., Haendler, S., Leverd, F., Gouraud, P., Scheiblin, P., Clement, L., Pantel, R., Deleonibus, S., Skotnicki, T.
Published in Solid-state electronics (01.07.2009)
Published in Solid-state electronics (01.07.2009)
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Journal Article
FDSOI devices with thin BOX and ground plane integration for 32nm node and below
Fenouillet-Beranger, C., Denorme, S., Perreau, P., Buj, C., Faynot, O., Andrieu, F., Tosti, L., Barnola, S., Salvetat, T., Garros, X., Casse, M., Allain, F., Loubet, N., Pham-NGuyen, L., Deloffre, E., Gros-Jean, M., Beneyton, R., Laviron, C., Marin, M., Leyris, C., Haendler, S., Leverd, F., Gouraud, P., Scheiblin, P., Clement, L., Pantel, R., Deleonibus, S., Skotnicki, T.
Published in ESSDERC 2008 - 38th European Solid-State Device Research Conference (01.09.2008)
Published in ESSDERC 2008 - 38th European Solid-State Device Research Conference (01.09.2008)
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Conference Proceeding
Ultra Compact FDSOI Transistors including Strain and Orientation: Processing and Performance
Fenouillet-Beranger, Claire, Pham Nguyen, Loan, Perreau, Pierre, Denorme, Stephane, Andrieu, Francois, Faynot, Olivier, Tosti, Lucie, Brevard, Laurent, Buj, Christel, Weber, Olivier, Gallon, Claire, Fiori, V., Boeuf, Frederic, Cristoloveanu, S., Skotnicki, Thomas
Published in ECS transactions (15.05.2009)
Published in ECS transactions (15.05.2009)
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Journal Article
25nm Short and Narrow Strained FDSOI with TiN/HfO2 Gate Stack
Deleonibus, S., Mazure, C., Gaud, P., Grampeix, H., Colonna, J.P., Previtali, B., Dansas, H., Lafond, D., Jahan, C., Fenouillet-Beranger, C., Ernst, T., Denorme, S., Vandooren, A., Cluzel, J., Barbe, J.C., Allain, F., Brevard, L., Cayrefoureq, I., Ghyselen, B., Casse, M., Rouchouze, E., Buj, C., Tosti, L., Faynot, O., Rochette, F., Dupre, C., Andrieu, F.
Published in 2006 Symposium on VLSI Technology, 2006. Digest of Technical Papers (2006)
Published in 2006 Symposium on VLSI Technology, 2006. Digest of Technical Papers (2006)
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Conference Proceeding
Impact of Mobility Boosters (XsSOI, CESL, TiN gate) on the Performance of or oriented FDSOI cMOSFETs for the 32nm Node
Andrieu, F., Aussenac, F., Feruglio, S., Eymery, J., Akatsu, T., Maury, P., Brevard, L., Tosti, L., Dansas, H., Rouchouze, E., Hartmann, J.-M., Faynot, O., Vandroux, L., Casse, M., Boeuf, F., Fenouillet-Beranger, C., Brunier, F., Cayrefourcq, I., Mazure, C., Ghibaudo, G., Deleonibus, S., Rochette, F., Barbe, J.-C., Buj, C., Bogumilowicz, Y., Allain, F., Delaye, V., Lafond, D.
Published in 2007 IEEE Symposium on VLSI Technology (01.06.2007)
Published in 2007 IEEE Symposium on VLSI Technology (01.06.2007)
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Conference Proceeding
GaN HEMTs on silicon for power devices
Escoffier, R., Torres, A., Fayolle-Lecocq, M., Buj-Dufournet, C., Morvan, E., Charles, M., Poisson, M. A.
Published in 2012 IEEE International SOI Conference (SOI) (01.10.2012)
Published in 2012 IEEE International SOI Conference (SOI) (01.10.2012)
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Conference Proceeding
600V bipolar power devices on thick SOI
Clavelier, L., Dartigues, A., Buj, C., Charlet, B., Gidon, P., Giffard, B., Gimonet, S., Roy, M., Schaeffer, C.
Published in 31st European Solid-State Device Research Conference (2001)
Published in 31st European Solid-State Device Research Conference (2001)
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Conference Proceeding
High Scalability and Low Variability of Planar Fully Depleted SOI MOSFETs
Weber, Olivier, Andrieu, Francois, Fenouillet-Béranger, Claire, Buj-Dufournet, Christel, Barral, Vincent, Perreau, Pierre, Tosti, Lucie, Brevard, Laurent, Faynot, Olivier
Published in ECS transactions (10.07.2009)
Published in ECS transactions (10.07.2009)
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Journal Article
HF Characterisation of sub-100nm UTB-FDSOI with TiN/HfO2 Gate stack
Lim, T.C., Rozeau, O., Buj, C., Paccaud, M., Dambrine, G., Danneville, F.
Published in 2008 9th International Conference on Ultimate Integration of Silicon (01.03.2008)
Published in 2008 9th International Conference on Ultimate Integration of Silicon (01.03.2008)
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