The influence of the UV and UV-VIS radiation on the hydrophilicity of the TiO2 - (r)GO thin films used as photocatalytic self-cleaning coatings
Tismanar, I., Munteanu, A., Andronache, S., Obreja, A. C., Buiu, O., Duta, A.
Published in 2022 International Semiconductor Conference (CAS) (12.10.2022)
Published in 2022 International Semiconductor Conference (CAS) (12.10.2022)
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Conference Proceeding
Photocatalytic activity and stability of the ZnO-GO composite thin films
Bogatu, C., Gheorghita, S., Perniu, D., Obreja, C., Buiu, O., Duta, A.
Published in 2021 International Semiconductor Conference (CAS) (06.10.2021)
Published in 2021 International Semiconductor Conference (CAS) (06.10.2021)
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Conference Proceeding
Navigation aids in the search for future high- k dielectrics: Physical and electrical trends
Engström, O., Raeissi, B., Hall, S., Buiu, O., Lemme, M.C., Gottlob, H.D.B., Hurley, P.K., Cherkaoui, K.
Published in Solid-state electronics (01.04.2007)
Published in Solid-state electronics (01.04.2007)
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Journal Article
Substrate impact on optical and microstructural properties of TiO2–PEG sol–gel films
Anastasescu, M., Teodorescu, V.S., Buiu, O., Osiceanu, P., Calderon-Moreno, J.M., Predoana, L., Preda, S., Nicolescu, M., Marin, A., Serban, B., Mihaila, M., Stoica, M., Zaharescu, M., Gartner, M.
Published in Ceramics international (01.09.2014)
Published in Ceramics international (01.09.2014)
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Journal Article
Ellipsometric analysis of mixed metal oxides thin films
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Journal Article
Conference Proceeding
Improved vertical MOSFET performance using an epitaxial channel and a stacked silicon-insulator structure
Uchino, T, Gili, E, Tan, L, Buiu, O, Hall, S, Ashburn, P
Published in Semiconductor science and technology (01.06.2012)
Published in Semiconductor science and technology (01.06.2012)
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Journal Article
High-k-oxide/silicon interfaces characterized by capacitance frequency spectroscopy
Raeissi, B., Piscator, J., Engström, O., Hall, S., Buiu, O., Lemme, M.C., Gottlob, H.D.B., Hurley, P.K., Cherkaoui, K., Osten, H.J.
Published in Solid-state electronics (01.09.2008)
Published in Solid-state electronics (01.09.2008)
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Journal Article
Conference Proceeding
Spectroellipsometric assessment of HfO2 thin films
BUIU, O, LU, Y, MITROVIC, I. Z, HALL, S, CHALKER, P, POTTER, R. J
Published in Thin solid films (25.10.2006)
Published in Thin solid films (25.10.2006)
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Conference Proceeding
Journal Article
Talc-impregnated polyimide for humidity sensors with improved hysteresis
Serban, B., Avramescu, V., Brezeanu, M., Gavrila, R., Dinescu, A., Buiu, O., Cobianu, C., Beck, S., Moffat, B.
Published in 2015 International Semiconductor Conference (CAS) (01.10.2015)
Published in 2015 International Semiconductor Conference (CAS) (01.10.2015)
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Conference Proceeding
Journal Article
Improved sub-threshold slope in short-channel vertical MOSFETs using FILOX oxidation
Hakim, M.M.A., Tan, L., Buiu, O., Redman-White, W., Hall, S., Ashburn, P.
Published in Solid-state electronics (01.07.2009)
Published in Solid-state electronics (01.07.2009)
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Journal Article
Conference Proceeding
Estimate of dielectric density using spectroscopic ellipsometry
Davey, W., Buiu, O., Werner, M., Mitrovic, I.Z., Hall, S., Chalker, P.
Published in Microelectronic engineering (01.07.2009)
Published in Microelectronic engineering (01.07.2009)
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Journal Article
Conference Proceeding
Electrical and structural properties of hafnium silicate thin films
Mitrovic, I.Z., Buiu, O., Hall, S., Bungey, C., Wagner, T., Davey, W., Lu, Y.
Published in Microelectronics and reliability (01.04.2007)
Published in Microelectronics and reliability (01.04.2007)
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Journal Article
Conference Proceeding
Chemical and optical profiling of ultra thin high- k dielectrics on silicon
Bernardini, S., MacKenzie, M., Buiu, O., Bailey, P., Noakes, T.C.Q., Davey, W.M., Hamilton, B., Hall, S.
Published in Thin solid films (03.11.2008)
Published in Thin solid films (03.11.2008)
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Journal Article
Conference Proceeding
Review of SiGe HBTs on SOI
Mitrovic, I.Z., Buiu, O., Hall, S., Bagnall, D.M., Ashburn, P.
Published in Solid-state electronics (2005)
Published in Solid-state electronics (2005)
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Journal Article
Shallow junctions on pillar sidewalls for sub-100-nm vertical MOSFETs
Gili, E., Uchino, T., Hakim, M.M.A., de Groot, C.H., Buiu, O., Hall, S., Ashburn, P.
Published in IEEE electron device letters (01.08.2006)
Published in IEEE electron device letters (01.08.2006)
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Journal Article
Optical and electrical characterization of hafnium oxide deposited by liquid injection atomic layer deposition
Taechakumput, P., Taylor, S., Buiu, O., Potter, R.J., Chalker, P.R., Jones, A.C.
Published in Microelectronics and reliability (01.04.2007)
Published in Microelectronics and reliability (01.04.2007)
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Journal Article
Conference Proceeding
Real-time observation of charging dynamics in hafnium silicate films using MOS capacitance transients
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Conference Proceeding
Optical and electrical characterization of hafnium oxide deposited by MOCVD
Lu, Y., Buiu, O., Hall, S., K. Hurley, P.
Published in Microelectronics and reliability (01.05.2005)
Published in Microelectronics and reliability (01.05.2005)
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Conference Proceeding