GaN-based power devices: Physics, reliability, and perspectives
Meneghini, Matteo, De Santi, Carlo, Abid, Idriss, Buffolo, Matteo, Cioni, Marcello, Khadar, Riyaz Abdul, Nela, Luca, Zagni, Nicolò, Chini, Alessandro, Medjdoub, Farid, Meneghesso, Gaudenzio, Verzellesi, Giovanni, Zanoni, Enrico, Matioli, Elison
Published in Journal of applied physics (14.11.2021)
Published in Journal of applied physics (14.11.2021)
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Journal Article
Photon-induced degradation of InGaN-based LED in open-circuit conditions investigated by steady-state photocapacitance and photoluminescence
Caria, Alessandro, De Santi, Carlo, Buffolo, Matteo, Meneghesso, Gaudenzio, Zanoni, Enrico, Meneghini, Matteo
Published in Journal of applied physics (31.01.2022)
Published in Journal of applied physics (31.01.2022)
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Journal Article
Modeling the electrical degradation of AlGaN-based UV-C LEDs by combined deep-level optical spectroscopy and TCAD simulations
Roccato, Nicola, Piva, Francesco, De Santi, Carlo, Buffolo, Matteo, Fregolent, Manuel, Pilati, Marco, Susilo, Norman, Vidal, Daniel Hauer, Muhin, Anton, Sulmoni, Luca, Wernicke, Tim, Kneissl, Michael, Meneghesso, Gaudenzio, Zanoni, Enrico, Meneghini, Matteo
Published in Applied physics letters (17.04.2023)
Published in Applied physics letters (17.04.2023)
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Journal Article
Quantum efficiency of InGaN–GaN multi-quantum well solar cells: Experimental characterization and modeling
Caria, Alessandro, Nicoletto, Marco, De Santi, Carlo, Buffolo, Matteo, Huang, Xuanqi, Fu, Houqiang, Chen, Hong, Zhao, Yuji, Meneghesso, Gaudenzio, Zanoni, Enrico, Meneghini, Matteo
Published in Journal of applied physics (14.06.2022)
Published in Journal of applied physics (14.06.2022)
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Journal Article
Impact of thermal annealing on deep levels in nitrogen-implanted β-Ga2O3 Schottky barrier diodes
Fregolent, Manuel, De Santi, Carlo, Buffolo, Matteo, Higashiwaki, Masataka, Meneghesso, Gaudenzio, Zanoni, Enrico, Meneghini, Matteo
Published in Journal of applied physics (28.12.2021)
Published in Journal of applied physics (28.12.2021)
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Journal Article
Laser-Based Lighting: Experimental Analysis and Perspectives
Trivellin, Nicola, Yushchenko, Maksym, Buffolo, Matteo, De Santi, Carlo, Meneghini, Matteo, Meneghesso, Gaudenzio, Zanoni, Enrico
Published in Materials (11.10.2017)
Published in Materials (11.10.2017)
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Journal Article
Deep levels and carrier capture kinetics in n-GaAsBi alloys investigated by deep level transient spectroscopy
Fregolent, Manuel, Buffolo, Matteo, De Santi, Carlo, Hasegawa, Sho, Matsumura, Junta, Nishinaka, Hiroyuki, Yoshimoto, Masahiro, Meneghesso, Gaudenzio, Zanoni, Enrico, Meneghini, Matteo
Published in Journal of physics. D, Applied physics (26.08.2021)
Published in Journal of physics. D, Applied physics (26.08.2021)
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Journal Article
Inactivating SARS-CoV-2 Using 275 nm UV-C LEDs through a Spherical Irradiation Box: Design, Characterization and Validation
Trivellin, Nicola, Buffolo, Matteo, Onelia, Francesco, Pizzolato, Alberto, Barbato, Marco, Orlandi, Viviana Teresa, Del Vecchio, Claudia, Dughiero, Fabrizio, Zanoni, Enrico, Meneghesso, Gaudenzio, Crisanti, Andrea, Meneghini, Matteo
Published in Materials (29.04.2021)
Published in Materials (29.04.2021)
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Journal Article
Physical Origin of the Optical Degradation of InAs Quantum Dot Lasers
Buffolo, Matteo, Samparisi, Fabio, De Santi, Carlo, Daehwan Jung, Norman, Justin, Bowers, John E., Herrick, Robert W., Meneghesso, Gaudenzio, Zanoni, Enrico, Meneghini, Matteo
Published in IEEE journal of quantum electronics (01.06.2019)
Published in IEEE journal of quantum electronics (01.06.2019)
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Journal Article
Challenges and Perspectives for Vertical GaN-on-Si Trench MOS Reliability: From Leakage Current Analysis to Gate Stack Optimization
Mukherjee, Kalparupa, De Santi, Carlo, Borga, Matteo, Geens, Karen, You, Shuzhen, Bakeroot, Benoit, Decoutere, Stefaan, Diehle, Patrick, Hübner, Susanne, Altmann, Frank, Buffolo, Matteo, Meneghesso, Gaudenzio, Zanoni, Enrico, Meneghini, Matteo
Published in Materials (29.04.2021)
Published in Materials (29.04.2021)
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Journal Article
Evidence for defect-assisted tunneling and recombination at extremely low current in InGaN/GaN-based LEDs
De Santi, Carlo, Buffolo, Matteo, Renso, Nicola, Neviani, Andrea, Meneghesso, Gaudenzio, Zanoni, Enrico, Meneghini, Matteo
Published in Applied physics express (01.05.2019)
Published in Applied physics express (01.05.2019)
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Journal Article
Modeling of the Electrical Characteristics and Degradation Mechanisms of UV-C LEDs
Roccato, Nicola, Piva, Francesco, De Santi, Carlo, Buffolo, Matteo, Susilo, Normal, Vidal, Daniel Hauer, Muhin, Anton, Sulmoni, Luca, Wernicke, Tim, Kneissl, Micheal, Meneghesso, Gaudenzio, Zanoni, Enrico, Meneghini, Matteo
Published in IEEE photonics journal (01.02.2024)
Published in IEEE photonics journal (01.02.2024)
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Journal Article
Degradation processes of 280 nm high power DUV LEDs: impact on parasitic luminescence
Trivellin, Nicola, Monti, Desiree, Piva, Francesco, Buffolo, Matteo, De Santi, Carlo, Zanoni, Enrico, Meneghesso, Gaudenzio, Meneghini, Matteo
Published in Japanese Journal of Applied Physics (01.06.2019)
Published in Japanese Journal of Applied Physics (01.06.2019)
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Journal Article
Lifetime Prediction of Current-and Temperature-Induced Degradation in Silicone-Encapsulated 365 nm High-Power Light-Emitting Diodes
Herzog, Alexander, Benkner, Simon, Zandi, Babak, Buffolo, Matteo, Van Driel, Willem D., Meneghini, Matteo, Khanh, Tran Quoc
Published in IEEE access (2023)
Published in IEEE access (2023)
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Journal Article
UV-Based Technologies for SARS-CoV2 Inactivation: Status and Perspectives
Trivellin, Nicola, Piva, Francesco, Fiorimonte, Davide, Buffolo, Matteo, De Santi, Carlo, Orlandi, Viviana Teresa, Dughiero, Fabrizio, Meneghesso, Gaudenzio, Zanoni, Enrico, Meneghini, Matteo
Published in Electronics (Basel) (16.07.2021)
Published in Electronics (Basel) (16.07.2021)
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Journal Article
Dynamic Performance Characterization Techniques in Gallium Nitride-Based Electronic Devices
De Santi, Carlo, Buffolo, Matteo, Meneghesso, Gaudenzio, Zanoni, Enrico, Meneghini, Matteo
Published in Crystals (Basel) (01.09.2021)
Published in Crystals (Basel) (01.09.2021)
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Journal Article
Impact of Generation and Relocation of Defects on Optical Degradation of Multi-Quantum-Well InGaN/GaN-Based Light-Emitting Diode
Casu, Claudia, Buffolo, Matteo, Caria, Alessandro, De Santi, Carlo, Zanoni, Enrico, Meneghesso, Gaudenzio, Meneghini, Matteo
Published in Micromachines (Basel) (01.08.2022)
Published in Micromachines (Basel) (01.08.2022)
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Journal Article
Negative Activation Energy of Gate Reliability in Schottky-Gate p-GaN HEMTs: Combined Gate Leakage Current Modeling and Spectral Electroluminescence Investigation
Fregolent, Manuel, Boito, Mirco, Disaro, Michele, Santi, Carlo De, Buffolo, Matteo, Canato, Eleonora, Gallo, Michele, Miccoli, Cristina, Rossetto, Isabella, Pizzo, Giansalvo, Russo, Alfio, Iucolano, Ferdinando, Meneghesso, Gaudenzio, Zanoni, Enrico, Meneghini, Matteo
Published in IEEE journal of the Electron Devices Society (01.01.2024)
Published in IEEE journal of the Electron Devices Society (01.01.2024)
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Journal Article
Understanding the Leakage Mechanisms and Breakdown Limits of Vertical GaN-on-Si p + n - n Diodes: The Road to Reliable Vertical MOSFETs
Mukherjee, Kalparupa, De Santi, Carlo, Buffolo, Matteo, Borga, Matteo, You, Shuzhen, Geens, Karen, Bakeroot, Benoit, Decoutere, Stefaan, Gerosa, Andrea, Meneghesso, Gaudenzio, Zanoni, Enrico, Meneghini, Matteo
Published in Micromachines (Basel) (16.04.2021)
Published in Micromachines (Basel) (16.04.2021)
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Journal Article