SOS Device radiation effects and hardening
Buchanan, B.L., Neamen, D.A., Shedd, W.M.
Published in IEEE transactions on electron devices (01.08.1978)
Published in IEEE transactions on electron devices (01.08.1978)
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Journal Article
Effect of implantation energy on surface pitting of SIMOX
Namavar, F., Cortesi, E., Manke, J.M., Kalkhoran, N.M., Buchanan, B.L., Pinizzotto, R.F., Yang, H.
Published in 1991 IEEE International SOI Conference Proceedings (1991)
Published in 1991 IEEE International SOI Conference Proceedings (1991)
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Conference Proceeding
Characterization of low energy SIMOX (LES) structures
Namavar, F., Cortesi, E., Kalkhoran, N.M., Manke, J.M., Buchanan, B.L.
Published in 1990 IEEE SOS/SOI Technology Conference. Proceedings (1990)
Published in 1990 IEEE SOS/SOI Technology Conference. Proceedings (1990)
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Conference Proceeding
Epitaxial GeSi strained layer on SIMOX for confinement of threading dislocations
Cortesi, E., Namavar, F., Kalkhoran, N.M., Manke, J.M., Buchanan, B.L.
Published in 1990 IEEE SOS/SOI Technology Conference. Proceedings (1990)
Published in 1990 IEEE SOS/SOI Technology Conference. Proceedings (1990)
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Conference Proceeding