Uniform Crystal Formation and Electrical Variability Reduction in Hafnium-Oxide-Based Ferroelectric Memory by Thermal Engineering
De, Sourav, Qiu, Bo-Han, Bu, Wei-Xuan, Baig, Mohammad Aftab, Sung, Po-Jung, Su, Chun-Jung, Lee, Yao-Jen, Lu, Darsen D
Published in ACS applied electronic materials (23.02.2021)
Published in ACS applied electronic materials (23.02.2021)
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Journal Article
Alleviation of Charge Trapping and Flicker Noise in HfZrO2-Based Ferroelectric Capacitors by Thermal Engineering
De, Sourav, Bu, Wei-Xuan, Qiu, Bo-Han, Su, Chung-Jun, Lee, Yao-Jen, Lu, Darsen D.
Published in 2021 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) (19.04.2021)
Published in 2021 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) (19.04.2021)
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Conference Proceeding
Neuromorphic Computing with Ferroelectric FinFETs in the Presence of Temperature, Process Variation, Device Aging and Flicker Noise
De, Sourav, Qiu, Bo-Han, Bu, Wei-Xuan, Baig, Md. Aftab, Su, Chung-Jun, Lee, Yao-Jen, Lu, Darsen
Year of Publication 04.03.2021
Year of Publication 04.03.2021
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Journal Article