High-Performance Deep Submicron Ge pMOSFETs With Halo Implants
Nicholas, G., De Jaeger, B., Brunco, D.P., Zimmerman, P., Eneman, G., Martens, K., Meuris, M., Heyns, M.M.
Published in IEEE transactions on electron devices (01.09.2007)
Published in IEEE transactions on electron devices (01.09.2007)
Get full text
Journal Article
Impact of Donor Concentration, Electric Field, and Temperature Effects on the Leakage Current in Germanium p +/n Junctions
Eneman, G., Wiot, M., Brugere, A., Casain, O.S.I., Sonde, S., Brunco, D.P., De Jaeger, B., Satta, A., Hellings, G., De Meyer, K., Claeys, C., Meuris, M., Heyns, M.M., Simoen, E.
Published in IEEE transactions on electron devices (01.09.2008)
Published in IEEE transactions on electron devices (01.09.2008)
Get full text
Journal Article
High Performance 70-nm Germanium pMOSFETs With Boron LDD Implants
Hellings, G., Mitard, J., Eneman, G., De Jaeger, B., Brunco, D.P., Shamiryan, D., Vandeweyer, T., Meuris, M., Heyns, M.M., De Meyer, K.
Published in IEEE electron device letters (01.01.2009)
Published in IEEE electron device letters (01.01.2009)
Get full text
Journal Article
Scaling to Sub-1 nm Equivalent Oxide Thickness with Hafnium Oxide Deposited by Atomic Layer Deposition
Delabie, Annelies, Caymax, Matty, Brijs, Bert, Brunco, David P., Conard, Thierry, Sleeckx, Erik, Van Elshocht, Sven, Ragnarsson, Lars-Åke, De Gendt, Stefan, Heyns, Marc M.
Published in Journal of the Electrochemical Society (01.01.2006)
Published in Journal of the Electrochemical Society (01.01.2006)
Get full text
Journal Article
Quantification of Drain Extension Leakage in a Scaled Bulk Germanium PMOS Technology
Eneman, G., De Jaeger, B., Simoen, E., Brunco, D.P., Hellings, G., Mitard, J., De Meyer, K., Meuris, M., Heyns, M.M.
Published in IEEE transactions on electron devices (01.12.2009)
Published in IEEE transactions on electron devices (01.12.2009)
Get full text
Journal Article
Germanium MOSFETs with CeO2/HfO2/TiN gate stacks
NICHOLAS, Gareth, BRUNCO, David P, DIMOULAS, A, VAN STEENBERGEN, Jan, BELLENGER, Florence, HOUSSA, Michel, CAYMAX, Matty, MEURIS, Marc, PANAYIOTATOS, Y, SOTIROPOULOS, Andreas
Published in IEEE transactions on electron devices (01.06.2007)
Published in IEEE transactions on electron devices (01.06.2007)
Get full text
Journal Article
Electrical characteristics of 8-Å EOT HfO2/TaN low thermal-budget n-channel FETs with solid-phase epitaxially regrown junctions
RAGNARSSON, Lars-Ake, SEVEN, Simone, KAUSHIK, Vidya S, DE GENDT, Stefan, TSAI, Wilman, GROESENEKEN, Guido, DE MEYER, Kristin, HEYNS, Marc, TROJMAN, Lionel, JOHNSON, Kevin D, BRUNCO, David P, AOULAICHE, Marc, HOUSSA, Michel, KAUERAUF, Thomas, DEGRAEVE, Robin, DELABIE, Annelies
Published in IEEE transactions on electron devices (01.07.2006)
Published in IEEE transactions on electron devices (01.07.2006)
Get full text
Journal Article
Understanding and Optimization of Hot-Carrier Reliability in Germanium-on-Silicon pMOSFETs
Maji, D., Crupi, F., Amat, E., Simoen, E., De Jaeger, B., Brunco, D.P., Manoj, C.R., Rao, V.R., Magnone, P., Giusi, G., Pace, C., Pantisano, L., Mitard, J., Rodriguez, R., Nafria, M.
Published in IEEE transactions on electron devices (01.05.2009)
Published in IEEE transactions on electron devices (01.05.2009)
Get full text
Journal Article
The Importance of Moisture Control for EOT Scaling of Hf-Based Dielectrics
Ragnarsson, Lars-Åke, Brunco, David P., Yamamoto, Kazuhiko, Tökei, Zsolt, Pourtois, Geoffrey, Delabie, Annelies, Parmentier, Brigitte, Conard, Thierry, Roussel, Philippe, De Gendt, Stefan, Heyns, Marc M.
Published in Journal of the Electrochemical Society (2009)
Published in Journal of the Electrochemical Society (2009)
Get full text
Journal Article
Distribution and generation of traps in SiO2/Al2O3 gate stacks
CRUPI, Isodiana, DEGRAEVE, Robin, GOVOREANU, Bogdan, BRUNCO, David P, ROUSSEL, Philippe, VAN HOUDT, Jan
Published in Microelectronics and reliability (01.04.2007)
Published in Microelectronics and reliability (01.04.2007)
Get full text
Conference Proceeding
Journal Article
Profiling of traps in SiO2/Al2O3 gate stack by the charge pumping technique
CRUPI, Isodiana, DEGRAEVE, Robin, GOVOREANU, Bogdan, BRUNCO, David P, ROUSSEL, Philippe, VAN HOUDT, Jan
Published in Materials science in semiconductor processing (01.12.2006)
Published in Materials science in semiconductor processing (01.12.2006)
Get full text
Conference Proceeding
Journal Article
Atomic Layer Deposition of High-k Dielectric Layers on Ge and III-V MOS Channels
Delabie, Annelies, Alian, A., Bellenger, Florence, Brammertz, Guy, Brunco, David P., Caymax, Matty, Conard, Thierry, Franquet, A., Houssa, Michel, Sioncke, Sonja, Van Elshocht, S., Van Hemmen, J. L., Keuning, W., Kessels, W. M., Avanasiev, Valery, Stesmans, Andre, Heyns, Marc M., Meuris, Marc
Published in ECS transactions (03.10.2008)
Published in ECS transactions (03.10.2008)
Get full text
Journal Article
Atomic Layer Deposition of Hafnium Oxide on Ge and GaAs Substrates: Precursors and Surface Preparation
Delabie, Annelies, Brunco, David P., Conard, Thierry, Favia, Paola, Bender, Hugo, Franquet, Alexis, Sioncke, Sonja, Vandervorst, Wilfried, Van Elshocht, Sven, Heyns, Marc, Meuris, Marc, Kim, Eunji, McIntyre, Paul C., Saraswat, Krishna C., LeBeau, James M., Cagnon, Joël, Stemmer, Susanne, Tsai, Wilman
Published in Journal of the Electrochemical Society (2008)
Published in Journal of the Electrochemical Society (2008)
Get full text
Journal Article
Etch Rates of Ge, GaAs and InGaAs in Acids, Bases and Peroxide Based Mixtures
Sioncke, Sonja, Brunco, David P., Meuris, Marc, Uwamahoro, Olivier, Van Steenbergen, Jan, Vrancken, Evi, Heyns, Marc M.
Published in ECS transactions (03.10.2008)
Published in ECS transactions (03.10.2008)
Get full text
Journal Article
Selective Epitaxial Growth of Germanium on Si Wafers with Shallow Trench Isolation: An Approach for Ge Virtual Substrates
Wang, Gang, Leys, Frederik E., Souriau, Laurent, Loo, Roger, Caymax, Matty, Brunco, David P., Geypen, Jef, Bender, Hugo, Meuris, Marc, Vandervorst, Wilfried, Heyns, Marc M.
Published in ECS transactions (2009)
Published in ECS transactions (2009)
Get full text
Journal Article
(Invited) Stress Simulations of Si- and Ge-Channel FinFETs for the 14 nm-Node and Beyond
Eneman, Geert, Brunco, David P., Witters, Liesbeth, Vincent, Benjamin, Favia, Paola, Hikavyy, Andriy, De Keersgieter, An, Mitard, Jerome, Loo, Roger, Veloso, Anabela, Richard, Olivier, Bender, Hugo, Vandervorst, Wilfried, Caymax, Matty, Horiguchi, Naoto, Collaert, Nadine, Thean, Aaron
Published in ECS transactions (03.05.2013)
Published in ECS transactions (03.05.2013)
Get full text
Journal Article
Germanium: The Past and Possibly a Future Material for Microelectronics
Brunco, David P., De Jaeger, Brice, Eneman, Geert, Satta, Alessandra, Terzieva, Valentina, Souriau, Laurent, Leys, Frederik E., Pourtois, Geoffrey, Houssa, Michel, Opsomer, Karl, Nicholas, Gareth, Meuris, Marc, Heyns, Marc
Published in ECS transactions (28.09.2007)
Published in ECS transactions (28.09.2007)
Get full text
Journal Article
Stress Techniques and Mobility Enhancement in FinFET Architectures
Eneman, Geert, Witters, Liesbeth, Mitard, Jerome, Hellings, Geert, De Keersgieter, An, Brunco, David P., Hikavyy, Andriy, Vincent, Benjamin, Simoen, Eddy, Favia, Paola, Bender, Hugo, Veloso, Anabela, Chiarella, Thomas, Boccardi, Guillaume, Kim, Minsoo, Togo, Mitsuhiro, Loo, Roger, De Meyer, Kristin, Horiguchi, Naoto, Collaert, Nadine, Thean, Aaron
Published in ECS transactions (01.01.2012)
Published in ECS transactions (01.01.2012)
Get full text
Journal Article