Development of a cryogenic indentation tool with in situ optical observation, application to the mechanical characterization of II-VI semiconductors
Broult, T, Kerlain, A, Destefanis, V, Guinedor, P, Bourhis, E Le, Patriarche, G
Published in Semiconductor science and technology (01.03.2021)
Published in Semiconductor science and technology (01.03.2021)
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Journal Article
Controlled Dislocations Injection in N/P Hg1−xCdxTe Photodiodes by Indentations
Broult, T., Kerlain, A., Destefanis, V., Guinedor, P., Le Bourhis, E., Patriarche, G.
Published in Journal of electronic materials (01.10.2019)
Published in Journal of electronic materials (01.10.2019)
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Journal Article
DLTS study of extended defects in HgCdTe photodiodes
Guinedor, P, Broult, T, Brunner, A, Rubaldo, L, Bauza, D, Reimbold, G, Kerlain, A, Destefanis, V
Published in Journal of physics. Conference series (01.05.2019)
Published in Journal of physics. Conference series (01.05.2019)
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Journal Article