by Borremans, J., Bevilacqua, A., Bronckers, S., Dehan, M., Kuijk, M., Wambacq, P., Craninckx, J.
Published in IEEE journal of solid-state circuits (01.12.2008)

by Bronckers, Stephane, Van der Plas, Geert, Vandersteen, Gerd, Rolain, Yves
Published in IEEE transactions on instrumentation and measurement (01.06.2010)

by Van der Plas, G, Limaye, P, Loi, I, Mercha, A, Oprins, H, Torregiani, C, Thijs, S, Linten, D, Stucchi, M, Katti, G, Velenis, D, Cherman, V, Vandevelde, B, Simons, V, De Wolf, I, Labie, R, Perry, D, Bronckers, S, Minas, N, Cupac, M, Ruythooren, W, Van Olmen, J, Phommahaxay, A, de Potter de ten Broeck, M, Opdebeeck, A, Rakowski, M, De Wachter, B, Dehan, M, Nelis, M, Agarwal, R, Pullini, A, Angiolini, F, Benini, L, Dehaene, W, Travaly, Y, Beyne, E, Marchal, P
Published in IEEE journal of solid-state circuits (01.01.2011)

by Scheir, K., Bronckers, S., Borremans, J., Wambacq, P., Rolain, Y.
Published in IEEE journal of solid-state circuits (01.12.2008)

by Van der Plas, G., Limaye, P., Mercha, A., Oprins, H., Torregiani, C., Thijs, S., Linten, D., Stucchi, M., Guruprasad, K., Velenis, D., Shinichi, D., Cherman, V., Vandevelde, B., Simons, V., De Wolf, I., Labie, R., Perry, D., Bronckers, S., Minas, N., Cupac, M., Ruythooren, W., Van Olmen, J., Phommahaxay, A., de Potter de ten Broeck, M., Opdebeeck, A., Rakowski, M., De Wachter, B., Dehan, M., Nelis, M., Agarwal, R., Dehaene, W., Travaly, Y., Marchal, P., Beyne, E.
Published in 2010 IEEE International Solid-State Circuits Conference - (ISSCC) (01.02.2010)

by Bronckers, S., Scheir, K., Van der Plas, G., Vandersteen, G., Rolain, Y.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.11.2009)

by Bronckers, S., Vandersteen, G., De Locht, L., Libois, M., Van der Plas, G., Rolain, Y.
Published in IEEE transactions on instrumentation and measurement (01.08.2009)

by Van Reusel, Koen, Bronckers, Stephane
Published in 2016 17th International Conference on Harmonics and Quality of Power (ICHQP) (01.10.2016)

by Wambacq, P., Raczkowski, K., Ramon, V., Vasylchenko, A., Enayati, A., Libois, M., Borremans, J., Scheir, K., Bronckers, S., Bourdoux, A., Parvais, B., Verbruggen, B., Brebels, S., Van Thillo, W., Pavageau, C., Nauwelaers, B., Vandenbosch, G., De Raedt, W., Soens, C.
Published in 2009 Annual IEEE Compound Semiconductor Integrated Circuit Symposium (01.10.2009)

by Vandersteen, G., Bronckers, S., Dobrovolny, P., Rolain, Y.
Published in Proceedings of the Design Automation & Test in Europe Conference (2006)

by Marchal, P, Van der Plas, G, Limaye, P, Mercha, A, Thijs, S, Linten, D, Guruprasad, K, Stucchi, M, Vandevelde, B, Bronckers, S, Minas, N, Cupac, M, Dehan, M, Nelis, M, Agarwal, R, Dehaene, W, Travaly, Y, Beyne, E
Published in Proceedings of 2010 International Symposium on VLSI Technology, System and Application (01.04.2010)