by Scheir, K., Bronckers, S., Borremans, J., Wambacq, P., Rolain, Y.
Published in IEEE journal of solid-state circuits (01.12.2008)

by Borremans, J., Bevilacqua, A., Bronckers, S., Dehan, M., Kuijk, M., Wambacq, P., Craninckx, J.
Published in IEEE journal of solid-state circuits (01.12.2008)

by Bronckers, S., Scheir, K., Van der Plas, G., Vandersteen, G., Rolain, Y.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.11.2009)

by Scheir, K., Bronckers, S., Borremans, J., Wambacq, P., Rolain, Y.
Published in 2008 IEEE International Solid-State Circuits Conference - Digest of Technical Papers (01.02.2008)

by Bronckers, S., Vandersteen, G., De Locht, L., Van der Plas, G., Rolain, Y.
Published in 2008 IEEE Radio Frequency Integrated Circuits Symposium (01.06.2008)

by Van der Plas, G, Limaye, P, Loi, I, Mercha, A, Oprins, H, Torregiani, C, Thijs, S, Linten, D, Stucchi, M, Katti, G, Velenis, D, Cherman, V, Vandevelde, B, Simons, V, De Wolf, I, Labie, R, Perry, D, Bronckers, S, Minas, N, Cupac, M, Ruythooren, W, Van Olmen, J, Phommahaxay, A, de Potter de ten Broeck, M, Opdebeeck, A, Rakowski, M, De Wachter, B, Dehan, M, Nelis, M, Agarwal, R, Pullini, A, Angiolini, F, Benini, L, Dehaene, W, Travaly, Y, Beyne, E, Marchal, P
Published in IEEE journal of solid-state circuits (01.01.2011)

by Bronckers, S., Soens, C., Van der Plas, G., Vandersteen, G., Rolain, Y.
Published in Design, Automation, and Test in Europe: Proceedings of the conference on Design, automation and test in Europe; 16-20 Apr. 2007 (16.04.2007)

by Bronckers, S, Vandersteen, G, De Locht, L, Libois, M, Van der Plas, G, Rolain, Y
Published in IEEE transactions on instrumentation and measurement (01.08.2009)

by Bronckers, S, Vandersteen, G, de Locht, L, Libois, M, van der Plas, G, Rolain, Y
Published in IEEE transactions on instrumentation and measurement (01.08.2009)

by Van der Plas, G., Limaye, P., Mercha, A., Oprins, H., Torregiani, C., Thijs, S., Linten, D., Stucchi, M., Guruprasad, K., Velenis, D., Shinichi, D., Cherman, V., Vandevelde, B., Simons, V., De Wolf, I., Labie, R., Perry, D., Bronckers, S., Minas, N., Cupac, M., Ruythooren, W., Van Olmen, J., Phommahaxay, A., de Potter de ten Broeck, M., Opdebeeck, A., Rakowski, M., De Wachter, B., Dehan, M., Nelis, M., Agarwal, R., Dehaene, W., Travaly, Y., Marchal, P., Beyne, E.
Published in 2010 IEEE International Solid-State Circuits Conference - (ISSCC) (01.02.2010)

by Bronckers, S, Vandersteen, G, De Locht, L, Libois, M, Van der Plas, G, Rolain, Y
Published in IEEE transactions on instrumentation and measurement (01.01.2009)

by Bronckers, S., Vandersteen, G., De Locht, L., Libois, M., Van der Plas, G., Rolain, Y.
Published in IEEE transactions on instrumentation and measurement (01.08.2009)

by Bronckers, S., Vandersteen, G., van der Plas, G., Rolain, Y.
Published in 2007 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium (01.06.2007)

by Borremans, J., Bronckers, S., Wambacq, P., Kuijk, M., Craninckx, J.
Published in 2008 IEEE International Solid-State Circuits Conference - Digest of Technical Papers (01.02.2008)

by Bronckers, Stephane, Van der Plas, Geert
Year of Publication 2010

by Bronckers, S., Soens, C., Van der Plas, G., Vandersteen, G., Rolain, Y.
Published in 2007 Design, Automation & Test in Europe Conference & Exhibition (01.04.2007)

by Wambacq, P., Raczkowski, K., Ramon, V., Vasylchenko, A., Enayati, A., Libois, M., Borremans, J., Scheir, K., Bronckers, S., Bourdoux, A., Parvais, B., Verbruggen, B., Brebels, S., Van Thillo, W., Pavageau, C., Nauwelaers, B., Vandenbosch, G., De Raedt, W., Soens, C.
Published in 2009 Annual IEEE Compound Semiconductor Integrated Circuit Symposium (01.10.2009)

by Vandersteen, G., Bronckers, S., Dobrovolny, P., Rolain, Y.
Published in Proceedings of the Design Automation & Test in Europe Conference (2006)

by Bronckers, S., Scheir, K., Van der Plas, G., Rolain, Y.
Published in 2009 IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (01.01.2009)

by Bronckers, S., Vandersteen, G., Borremans, J., Vandermot, K., Van der Plas, G., Rolain, Y.
Published in 2008 IEEE Instrumentation and Measurement Technology Conference (01.05.2008)