Remaining useful life prediction of lithium batteries in calendar ageing for automotive applications
Eddahech, A., Briat, O., Woirgard, E., Vinassa, J.M.
Published in Microelectronics and reliability (01.09.2012)
Published in Microelectronics and reliability (01.09.2012)
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Journal Article
Conference Proceeding
Impact of temperature on calendar ageing of Lithium-ion battery using incremental capacity analysis
Maures, M., Zhang, Y., Martin, C., Delétage, J.-Y., Vinassa, J.-M., Briat, O.
Published in Microelectronics and reliability (01.09.2019)
Published in Microelectronics and reliability (01.09.2019)
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Journal Article
Characterization methods and modelling of ultracapacitors for use as peak power sources
Lajnef, W., Vinassa, J.-M., Briat, O., Azzopardi, S., Woirgard, E.
Published in Journal of power sources (01.06.2007)
Published in Journal of power sources (01.06.2007)
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Journal Article
Impact of Calendar Life and Cycling Ageing on Supercapacitor Performance
El Brouji, E.-H., Briat, O., Vinassa, J.-M., Bertrand, N., Woirgard, E.
Published in IEEE transactions on vehicular technology (01.10.2009)
Published in IEEE transactions on vehicular technology (01.10.2009)
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Journal Article
Chemical rate phenomenon approach applied to lithium battery capacity fade estimation
Baghdadi, I., Briat, O., Delétage, J.Y., Gyan, P., Vinassa, J.M.
Published in Microelectronics and reliability (01.09.2016)
Published in Microelectronics and reliability (01.09.2016)
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Journal Article
Prediction of supercapacitors floating ageing with surface electrode interface based ageing law
German, R., Sari, A., Venet, P., Ayadi, M., Briat, O., Vinassa, J.M.
Published in Microelectronics and reliability (01.09.2014)
Published in Microelectronics and reliability (01.09.2014)
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Conference Proceeding
Study on specific effects of high frequency ripple currents and temperature on supercapacitors ageing
German, R., Sari, A., Venet, P., Briat, O., Vinassa, J.-M.
Published in Microelectronics and reliability (01.08.2015)
Published in Microelectronics and reliability (01.08.2015)
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Journal Article
Description of supercapacitor performance degradation rate during thermal cycling under constant voltage ageing test
Ayadi, M., Briat, O., Lallemand, R., Eddahech, A., German, R., Coquery, G., Vinassa, J.M
Published in Microelectronics and reliability (01.09.2014)
Published in Microelectronics and reliability (01.09.2014)
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Journal Article
Conference Proceeding
Ageing monitoring of lithium-ion cell during power cycling tests
Eddahech, A., Briat, O., Henry, H., Delétage, J.-Y., Woirgard, E., Vinassa, J.-M.
Published in Microelectronics and reliability (01.09.2011)
Published in Microelectronics and reliability (01.09.2011)
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Journal Article
Conference Proceeding
Thermal cycling impacts on supercapacitor performances during calendar ageing
Ayadi, M., Briat, O., Eddahech, A., German, R., Coquery, G., Vinassa, J.M.
Published in Microelectronics and reliability (01.09.2013)
Published in Microelectronics and reliability (01.09.2013)
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Journal Article
Conference Proceeding
Impact of high frequency current ripple on supercapacitors ageing through floating ageing tests
German, R., Briat, O., Sari, A., Venet, P., Ayadi, M., Zitouni, Y., Vinassa, J.M.
Published in Microelectronics and reliability (01.09.2013)
Published in Microelectronics and reliability (01.09.2013)
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Journal Article
Conference Proceeding
How supercapacitors reach end of life criteria during calendar life and power cycling tests
Chaari, R., Briat, O., Delétage, J.Y., Woirgard, E., Vinassa, J.-M.
Published in Microelectronics and reliability (01.09.2011)
Published in Microelectronics and reliability (01.09.2011)
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Journal Article
Conference Proceeding
Contribution of calendar ageing modes in the performances degradation of supercapacitors during power cycling
Briat, O., Vinassa, J.-M., Bertrand, N., El Brouji, H., Delétage, J.-Y., Woirgard, E.
Published in Microelectronics and reliability (01.09.2010)
Published in Microelectronics and reliability (01.09.2010)
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Journal Article
Conference Proceeding
Comparison between changes of ultracapacitors model parameters during calendar life and power cycling ageing tests
El Brouji, H., Briat, O., Vinassa, J.-M., Bertrand, N., Woirgard, E.
Published in Microelectronics and reliability (01.08.2008)
Published in Microelectronics and reliability (01.08.2008)
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Journal Article
Conference Proceeding
Analysis of the dynamic behavior changes of supercapacitors during calendar life test under several voltages and temperatures conditions
El Brouji, H., Briat, O., Vinassa, J-M., Henry, H., Woirgard, E.
Published in Microelectronics and reliability (01.09.2009)
Published in Microelectronics and reliability (01.09.2009)
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Journal Article
Conference Proceeding
Lessons learned from Paris and Nice
Noël, S., François, A., Le Failler, F., Charpentier, F., Baudonnet, T., Bierling, P., Djoudi, R., Pirenne, F., Killic, S., Benomar, D., Corby, J.‐B., Fabra, C., Nicoué, C., Collet, M., Brosius, N., Briat, O., Spinardi, R., Chiaroni, J., David, V., Toujas, F.
Published in ISBT science series (01.02.2018)
Published in ISBT science series (01.02.2018)
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Journal Article
Quantification of ageing of ultracapacitors during cycling tests with current profile characteristics of hybrid and electric vehicles applications
LAJNEF, W, VINASSA, J.-M, BRIAT, O, EL BROUJI, H, AZZOPARDI, S, WOIRGARD, E
Published in IET electric power applications (01.09.2007)
Published in IET electric power applications (01.09.2007)
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Journal Article
Power cycling tests for accelerated ageing of ultracapacitors
Briat, O., Lajnef, W., Vinassa, J.-M., Woirgard, E.
Published in Microelectronics and reliability (01.09.2006)
Published in Microelectronics and reliability (01.09.2006)
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Conference Proceeding