Experiments on the relation between GMR and interface roughness and on the interlayer exchange coupling across semiconductors
Grünberg, P, Bürgler, D E, Gareev, R, Olligs, D, Buchmeier, M, Breidbach, M, Kuanr, B, Schreiber, R
Published in Journal of physics. D, Applied physics (07.10.2002)
Published in Journal of physics. D, Applied physics (07.10.2002)
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