Interpoly Oxide Related Fast Bit Failures in the Himos ™ Flash Memory Cell
Ackaert, J., Yao, T., Lowe, A., Gassot, P., Ooghe, W., Schlegel, L., Bogaert, P., Branquart, H.
Published in 2006 IEEE International Conference on IC Design and Technology (2006)
Published in 2006 IEEE International Conference on IC Design and Technology (2006)
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