Prognostic factors affecting outcomes in fistulating perianal Crohn’s disease: a systematic review
Braithwaite, G. C., Lee, M. J., Hind, D., Brown, S. R.
Published in Techniques in coloproctology (01.07.2017)
Published in Techniques in coloproctology (01.07.2017)
Get full text
Journal Article
Helicopter maintenance error analysis: Beyond the third order of the HFACS-ME
Rashid, H.S.J., Place, C.S., Braithwaite, G.R.
Published in International journal of industrial ergonomics (01.11.2010)
Published in International journal of industrial ergonomics (01.11.2010)
Get full text
Journal Article
Investigating the investigations: a retrospective study in the aviation maintenance error causation
Rashid, H. S. J., Place, C. S., Braithwaite, G. R.
Published in Cognition, technology & work (01.05.2013)
Published in Cognition, technology & work (01.05.2013)
Get full text
Journal Article
Eradicating root causes of aviation maintenance errors: introducing the AMMP
Rashid, H. S. J., Place, C. S., Braithwaite, G. R.
Published in Cognition, technology & work (01.02.2014)
Published in Cognition, technology & work (01.02.2014)
Get full text
Journal Article
Film thickness constraints for manufacturable strained silicon CMOS
Fiorenza, J G, Braithwaite, G, Leitz, C W, Currie, M T, Yap, J, Singaporewala, F, Yang, V K, Langdo, T A, Carlin, J, Somerville, M, Lochtefeld, A, Badawi, H, Bulsara, M T
Published in Semiconductor science and technology (01.01.2004)
Published in Semiconductor science and technology (01.01.2004)
Get full text
Journal Article
Strained Si on insulator technology: from materials to devices
Langdo, T.A, Currie, M.T, Cheng, Z.-Y, Fiorenza, J.G, Erdtmann, M, Braithwaite, G, Leitz, C.W, Vineis, C.J, Carlin, J.A, Lochtefeld, A, Bulsara, M.T, Lauer, I, Antoniadis, D.A, Somerville, M
Published in Solid-state electronics (01.08.2004)
Published in Solid-state electronics (01.08.2004)
Get full text
Journal Article
Scalability of strained-Si nMOSFETs down to 25 nm gate length
Jung-Suk Goo, Qi Xiang, Takamura, Y., Haihong Wang, Pan, J., Arasnia, F., Paton, E.N., Besser, P., Sidorov, M.V., Adem, E., Lochtefeld, A., Braithwaite, G., Currie, M.T., Hammond, R., Bulsara, M.T., Ming-Ren Lin
Published in IEEE electron device letters (01.05.2003)
Published in IEEE electron device letters (01.05.2003)
Get full text
Journal Article
Analysis of carrier generation lifetime in strained-Si/SiGe heterojunction MOSFETs from capacitance transient
Bera, L.K., Mathew, Shajan, Balasubramanian, N., Braithwaite, G., Currie, M.T., Singaporewala, F., Yap, J., Hammond, R., Lochtefeld, A., Bulsara, M.T., Fitzgerald, E.A.
Published in Applied surface science (15.03.2004)
Published in Applied surface science (15.03.2004)
Get full text
Journal Article
Conference Proceeding
Investigation of electrical properties of furnace grown gate oxide on strained-Si
Bera, L.K., Mathew, Shajan, Balasubramanian, N., Leitz, C., Braithwaite, G., Singaporewala, F., Yap, J., Carlin, J., Langdo, T., Lochtefeld, T., Currie, M., Hammond, R., Fiorenza, J., Badawi, H., Bulsara, M.
Published in Thin solid films (01.09.2004)
Published in Thin solid films (01.09.2004)
Get full text
Journal Article
Direct regrowth of thin strained silicon films on planarized relaxed silicon–germanium virtual substrates
Leitz, C.W., Vineis, C.J., Carlin, J., Fiorenza, J., Braithwaite, G., Westhoff, R., Yang, V., Carroll, M., Langdo, T.A., Matthews, K., Kohli, P., Rodder, M., Wise, R., Lochtefeld, A.
Published in Thin solid films (14.08.2006)
Published in Thin solid films (14.08.2006)
Get full text
Journal Article
Fully depleted n-MOSFETs on supercritical thickness strained SOI
Lauer, I., Langdo, T.A., Cheng, Z.-Y., Fiorenza, J.G., Braithwaite, G., Currie, M.T., Leitz, C.W., Lochtefeld, A., Badawi, H., Bulsara, M.T., Somerville, M., Antoniadis, D.A.
Published in IEEE electron device letters (01.02.2004)
Published in IEEE electron device letters (01.02.2004)
Get full text
Journal Article
Indication of velocity overshoot in strained Si0.8Ge0.2 p-channel MOSFETs
Kaya, S, Zhao, Y-P, Watling, J R, Asenov, A, Barker, J R, Ansaripour, G, Braithwaite, G, Whall, T E, Parker, E H C
Published in Semiconductor science and technology (01.06.2000)
Published in Semiconductor science and technology (01.06.2000)
Get full text
Journal Article
On the mobility extraction for HMOSFETs
Straube, U.N., Evans, A.G.R., Braithwaite, G., Kaya, S., Watling, J., Asenov, A.
Published in Solid-state electronics (01.03.2001)
Published in Solid-state electronics (01.03.2001)
Get full text
Journal Article