by Gong, N, Idé, T, Kim, S, Boybat, I, Sebastian, A, Narayanan, V, Ando, T
Published in Nature communications (29.05.2018)

by Bruce, R.L., Sarwat, S. Ghazi, Boybat, I., Cheng, C.-W., Kim, W., Nandakumar, S.R., Mackin, C., Philip, T., Liu, Z., Brew, K., Gong, N., Ok, I., Adusumilli, P., Spoon, K., Ambrogio, S., Kersting, B., Bohnstingl, T., Gallo, M. Le, Simon, A., Li, N., Saraf, I., Han, J.-P., Gignac, L., Papalia, J.M., Yamashita, T., Saulnier, N., Burr, G. W., Tsai, H., Sebastian, A., Narayanan, V., BrightSky, M.
Published in 2021 IEEE International Reliability Physics Symposium (IRPS) (01.03.2021)

by Burr, G. W., Narayanan, P., Shelby, R. M., Sidler, S., Boybat, I., di Nolfo, C., Leblebici, Y.
Published in 2015 IEEE International Electron Devices Meeting (IEDM) (01.12.2015)

by Burr, G. W., Tsai, H., Simon, W., Boybat, I., Ambrogio, S., Ho, C.-E., Liou, Z.-W., Rasch, M., Buchel, J., Narayanan, P., Gordon, T., Jain, S., Levin, T. M., Hosokawa, K., Le Gallo, M., Smith, H., Ishii, M., Kohda, Y., Chen, A., Mackin, C., Fasoli, A., ElMaghraoui, K., Muralidhar, R., Okazaki, A., Chen, C. -T., Frank, M. M., Lammie, C., Vasilopoulos, A., Friz, A. M., Luquin, J., Teehan, S., Ahsan, I., Sebastian, A., Narayanan, V.
Published in 2023 International Electron Devices Meeting (IEDM) (09.12.2023)

by Sebastian, A., Boybat, I., Dazzi, M., Giannopoulos, I., Jonnalagadda, V., Joshi, V., Karunaratne, G., Kersting, B., Khaddam-Aljameh, R., Nandakumar, S. R., Petropoulos, A., Piveteau, C., Antonakopoulos, T., Rajendran, B., Gallo, M. Le, Eleftheriou, E.
Published in 2019 Symposium on VLSI Technology (01.06.2019)

by Nandakumar, S. R., Boybat, I., Le Gallo, M., Sebastian, A., Rajendran, B., Eleftheriou, E.
Published in 2017 75th Annual Device Research Conference (DRC) (01.06.2017)

by Boybat, I., Kersting, B., Sarwat, S. Ghazi, Timoneda, X., Bruce, R. L., BrightSky, M., Gallo, M. Le, Sebastian, A.
Published in 2021 IEEE International Electron Devices Meeting (IEDM) (11.12.2021)

by Boybat, I., Nandakumar, S. R., Gallo, M. Le, Rajendran, B., Leblebici, Y., Sebastian, A., Eleftheriou, E.
Published in 2018 Non-Volatile Memory Technology Symposium (NVMTS) (01.10.2018)

by Sebastian, A., Boybat, I., Dazzi, M., Giannopoulos, I., Jonnalagadda, V., Joshi, V., Karunaratne, G., Kersting, B., Khaddam-Aljameh, R., Nandakumar, S. R., Petropoulos, A., Piveteau, C., Antonakopoulos, T., Rajendran, B., Gallo, M. Le, Eleftheriou, E.
Published in 2019 Symposium on VLSI Circuits (01.06.2019)