Reliability investigations of 850 nm silicon photodiodes under proton irradiation for space applications
Bourqui, M.L., Béchou, L., Gilard, O., Deshayes, Y., Vecchio, P. Del, How, L.S., Rosala, F., Ousten, Y., Touboul, A.
Published in Microelectronics and reliability (01.08.2008)
Published in Microelectronics and reliability (01.08.2008)
Get full text
Journal Article
Conference Proceeding
Preliminary results of storage accelerated aging test on InP/GaAsSb DHBT
Kone, G. A., Ghosh, S., Grandchamp, B., Maneux, C., Marc, F., Labat, N., Zimmer, T., Maher, H., Bourqui, M. L., Smith, D.
Published in IPRM 2011 - 23rd International Conference on Indium Phosphide and Related Materials (01.05.2011)
Get full text
Published in IPRM 2011 - 23rd International Conference on Indium Phosphide and Related Materials (01.05.2011)
Conference Proceeding