Infrared conductivity of hole accumulation and depletion layers in (Ga,Mn)As- and (Ga,Be)As-based electric field-effect devices
Chapler, B C, Mack, S, L Ju, Elson, T W, Boudouris, B W, Namdas, E, Yuen, J D, Heeger, A J, Samarth, N, M Di Ventra, Segalman, R A, Awschalom, D D, Wang, F, Basov, D N
Published in arXiv.org (06.07.2012)
Published in arXiv.org (06.07.2012)
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