Near-field techniques for detecting EMI sources
Baudry, D., Bicrel, F., Bouchelouk, L., Louis, A., Mazari, B., Eudeline, P.
Published in 2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) (2004)
Published in 2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) (2004)
Get full text
Conference Proceeding
Analysis of the propagation of electromagnetic disturbances inside integrated circuits using direct power injection and near-field scanning
Alaeldine, A., Bouchelouk, L., Perdriau, R., Ramdani, M.
Published in 2009 IEEE International Symposium on Electromagnetic Compatibility (01.08.2009)
Published in 2009 IEEE International Symposium on Electromagnetic Compatibility (01.08.2009)
Get full text
Conference Proceeding