Impact of Off-State Stress on SiGe-channel p-FETs in 22nm FDSOI under Large-Signal Operation
Huynh, Dang Khoa, Le, Quang Huy, Lehmann, Steffen, Zhao, Zhixing, Bossu, Germain, Arfaoui, Wafa, Kampfe, Thomas, Rudolph, Matthias
Published in 2023 18th European Microwave Integrated Circuits Conference (EuMIC) (18.09.2023)
Published in 2023 18th European Microwave Integrated Circuits Conference (EuMIC) (18.09.2023)
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Conference Proceeding
Impact of BTI Stress on RF Small Signal Parameters of FDSOI MOSFETs
Chohan, Talha, Slesazeck, Stefan, Trommer, Jens, Krause, Gernot, Bossu, Germain, Lehmann, Steffen, Mikolajick, Thomas
Published in 2019 IEEE International Integrated Reliability Workshop (IIRW) (01.10.2019)
Published in 2019 IEEE International Integrated Reliability Workshop (IIRW) (01.10.2019)
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Conference Proceeding
Reliability-Conscious MOSFET Compact Modeling with Focus on the Defect-Screening Effect of Hot-Carrier Injection
Vyas, Pratik B., Pimparkar, Ninad, Tu, Robert, Arfaoui, Wafa, Bossu, Germain, Siddabathula, Mahesh, Lehmann, Steffen, Goo, Jung-Suk, Icel, Ali B.
Published in 2021 IEEE International Reliability Physics Symposium (IRPS) (01.03.2021)
Published in 2021 IEEE International Reliability Physics Symposium (IRPS) (01.03.2021)
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Conference Proceeding
Off-state Impact on FDSOI Ring Oscillator Degradation under High Voltage Stress
Trommer, Jens, Havel, Viktor, Chohan, Talha, Mehmood, Furqan, Slesazeck, Stefan, Krause, Gernot, Bossu, Germain, Arfaoui, Wafa, Muhlhoff, Armin, Mikolajick, T.
Published in 2018 International Integrated Reliability Workshop (IIRW) (01.10.2018)
Published in 2018 International Integrated Reliability Workshop (IIRW) (01.10.2018)
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Conference Proceeding
FDSOI Floating Body Cell eDRAM Using Gate-Induced Drain-Leakage (GIDL) Write Current for High Speed and Low Power Applications
Puget, Sophie, Bossu, Germain, Fenouiller-Beranger, Claire, Perreau, Pierre, Masson, Pascal, Mazoyer, Pascale, Lorenzini, Philippe, Portal, Jean-Michel, Bouchakour, Rachid, Skotnicki, Thomas
Published in 2009 IEEE International Memory Workshop (01.05.2009)
Published in 2009 IEEE International Memory Workshop (01.05.2009)
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Conference Proceeding
Implication of Self-Heating Effect on Device Reliability Characterization of Multi-Finger n-MOSFETs on 22FDSOI
Chohan, Talha, Zhao, Zhixing, Lehmann, Steffen, Arfaoui, Wafa, Bossu, Germain, Trommer, Jens, Slesazeck, Stefan, Mikolajick, Thomas, Siddabathula, Mahesh
Published in IEEE transactions on device and materials reliability (01.09.2022)
Published in IEEE transactions on device and materials reliability (01.09.2022)
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Magazine Article
Thin film embedded memory solutions
Mazoyer, Pascale, Puget, Sophie, Bossu, Germain, Masson, Pascal, Lorenzini, Philippe, Portal, Jean Michel
Published in Current applied physics (2010)
Published in Current applied physics (2010)
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Journal Article
Modeling the Independent Double Gate Transistor in Accumulation Regime for 1TDRAM Application
Puget, Sophie, Bossu, Germain, Masson, Pascal, Mazoyer, Pascale, Ranica, Rossella, Villaret, Alexandre, Lorenzini, Philippe, Portal, Jean-Michel, Rideau, Denis, Ghibaudo, Gérard, Bouchakour, Rachid, Jacquemod, Gilles, Skotnicki, Thomas
Published in IEEE transactions on electron devices (01.04.2010)
Published in IEEE transactions on electron devices (01.04.2010)
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Journal Article
Analysis of RF Stress Influence on Large-Signal Performance of 22nm FDSOI CMOS Transistors utilizing Waveform Measurement
Huynh, Dang Khoa, Le, Quang Huy, Lehmann, Steffen, Zhao, Zhixing, Bossu, Germain, Arfaoui, Wafa, Wang, Defu, Kampfe, Thomas, Rudolph, Matthias
Published in 2021 16th European Microwave Integrated Circuits Conference (EuMIC) (03.04.2022)
Published in 2021 16th European Microwave Integrated Circuits Conference (EuMIC) (03.04.2022)
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Conference Proceeding