A GPS-Referenced Wavelength Standard for High-Precision Displacement Interferometry at λ = 633 nm
Blumröder, Ulrike, Köchert, Paul, Fröhlich, Thomas, Kissinger, Thomas, Ortlepp, Ingo, Flügge, Jens, Bosse, Harald, Manske, Eberhard
Published in Sensors (Basel, Switzerland) (03.02.2023)
Published in Sensors (Basel, Switzerland) (03.02.2023)
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Journal Article
Cantilever-Droplet-Based Sensing of Magnetic Particle Concentrations in Liquids
Nyang’au, Wilson Ombati, Setiono, Andi, Bertke, Maik, Bosse, Harald, Peiner, Erwin
Published in Sensors (Basel, Switzerland) (01.11.2019)
Published in Sensors (Basel, Switzerland) (01.11.2019)
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Journal Article
Using DNA origami nanorulers as traceable distance measurement standards and nanoscopic benchmark structures
Raab, Mario, Jusuk, Ija, Molle, Julia, Buhr, Egbert, Bodermann, Bernd, Bergmann, Detlef, Bosse, Harald, Tinnefeld, Philip
Published in Scientific reports (29.01.2018)
Published in Scientific reports (29.01.2018)
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Journal Article
Study on local indium concentration in Ga(1-x)InxN quantum wells using quantitative scanning transmission electron microscopy
Park, Daesung, Guckel, Jannik, Horenburg, Philipp, Bremers, Heiko, Rossow, Uwe, Hangleiter, Andreas, Bosse, Harald
Published in BIO web of conferences (2024)
Published in BIO web of conferences (2024)
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Journal Article
New frontiers in angle metrology at the PTB
Geckeler, Ralf D., Krause, Michael, Just, Andreas, Kranz, Oliver, Bosse, Harald
Published in Measurement : journal of the International Measurement Confederation (01.09.2015)
Published in Measurement : journal of the International Measurement Confederation (01.09.2015)
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Journal Article
Implementation of straightness measurements at the Nanometer Comparator
Weichert, Christoph, Bosse, Harald, Flügge, Jens, Köning, Rainer, Köchert, Paul, Wiegmann, Axel, Kunzmann, Horst
Published in CIRP annals (2016)
Published in CIRP annals (2016)
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Journal Article
The lattice parameter of silicon: a secondary realisation of the metre
Yacoot, Andrew, Bosse, Harald, Dixson, Ron
Published in Measurement science & technology (01.12.2020)
Published in Measurement science & technology (01.12.2020)
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Journal Article
Special issue on metrology in manufacturing—Editorial
Savio, Enrico, Carmignato, Simone, Bosse, Harald
Published in Measurement science & technology (01.04.2022)
Published in Measurement science & technology (01.04.2022)
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Journal Article
Fiber optic white light interferometer for areal surface measurement
Zhang, Guofeng, Yang, Shuming, Fluegge, Jens, Bosse, Harald
Published in Measurement science & technology (01.02.2020)
Published in Measurement science & technology (01.02.2020)
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Journal Article